Composition and thickness of the surface segregation region of a binary alloy system determined by a quantitative Auger electron spectroscopy method von Tokutaka, H., Nishimori, K., Tanaka, K., Takashima, K., Le Héricy, J., Langeron, J. P.

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Quantitative approach of Auger electron spectrometry: I. A formalism for the calculation of surface concentrations von Pons, F, Le Héricy, J, Langeron, J.P

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Quantitative approach of Auger electron spectrometry: II. Experimental part von Pons, F, Le Héricy, J, Langeron, J.P

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Croissance, par recristallisation secondaire, de gros cristaux exempts de macles dans le cuivre purifié par fusion de zone von Blainé, F, Le Héricy, J

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Quantitative approach of Auger electron spectrometry von Pons, F, Le Héricy, J, Langeron, J.P

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Quantitative approach of Auger electron spectrometry von Pons, F, Le Héricy, J, Langeron, J.P

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The effect of sulphur on residual resistivity of copper and silver von Mathieu, G, Cabane, F, Hericy, J Le

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Study by Auger Spectrometry and Cathodic Reduction of Passive Films Formed on Ferritic Stainless Steels von da Cunha Belo, M., Rondot, B., Pons, F., Le Héricy, J., Langeron, J. P.

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Surface composition analysis of Au-Cu alloy by micro-auger electron spectroscopy von Asahara, Y., Tokutaka, H., Nishimori, K., Ishihara, N., Makino, N., Héricy, J.Le, Langeron, J.P.

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Peculiarities of the Cu LVV Auger line in copper oxide cuprates and HTSC-materials studied by x-ray photoelectron and Auger electron spectroscopies von Akimov, A. G., Dementjev, A. P., Le Héricy, J., Kazansky, L. P., Khodan, A. N., Langeron, J. P., Melnikova, N. A., Rakhovsky, V. I., Vignes, J. L.

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The use of peak to background ratio in quantitative Auger analysis von Langeron, J.P., Minel, L., Vignes, J.L., Bouquet, S., Pellerin, F., Lorang, G., Ailloud, P., Le Héricy, J.

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An important step in quantitative auger analysis: The use of peak to background ratio von Langeron, J.P., Minel, L., Vignes, J.L., Bouquet, S., Pellerin, F., Lorang, G., Ailloud, P., Le Héricy, J.

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Cleanliness and pollution of Si(111) and Si(100) surface studied by AES von Vignes, J.-L., Denjean, P., Le Héricy, J., Langeron, J.-P.

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Studies of μ + Localization in Cu, Al, and Al Alloys in the Temperature Interval 0.03-100 K von Hartmann, O., Karlsson, E., Norlin, L. O., Niinikoski, T. O., Kehr, K. W., Richter, D., Welter, J. -M., Yaouanc, A., Le Hericy, J.

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Comments on “AES studies of surface composition of Ag-Cu alloys” BY P. Braun and W. Färber, and on “Quantitative Auger analysis of copper-nickel alloy surfaces after argon ion bomb... von Pons, F., Le Héricy, J., Langeron, J.P.

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Depth information in Auger electron spectroscopy von Vignes, J.L., Pellerin, F., Lorang, G., Bouquet, S., Le Héricy, J., Langeron, J.P.

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Chlorine migration under electron bombardment observed by aes von Bouquet, S., Bergner, J., Le Héricy, J., Langeron, J.P.

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Depth information in Auger electron spectroscopy von Vignes, J.L., Pellerin, F., Lorang, G., Bouquet, S., Le Héricy, J., Langeron, J.P.

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An important step in quantitative auger analysis: The use of peak to background ratio von Langeron, J.P., Minel, L., Vignes, J.L., Bouquet, S., Pellerin, F., Lorang, G., Ailloud, P., Le Héricy, J.

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