Imaging atomic motion of light elements in 2D materials with 30 kV electron microscopy von de Graaf, Sytze, Ahmadi, Majid, Lazi, Ivan, Bosch, Eric G. T, Kooi, Bart J

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3D characterization of nanowire devices with STEM based modes von Bender, Hugo, Bosch, Eric G T, Richard, Olivier, Mendez, David, Favia, Paola, Lazi, Ivan

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MULTI-BEAM SCANNING TRANSMISSION CHARGED PARTICLE MICROSCOPE von Mohammadi-Gheidari, Ali, Lazi, Ivan, Bosch, Eric Gerardus Theodoor, Veen, van, Gerard Nicolaas Anne

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Method of preparing and imaging a lamella in a particle-optical apparatus von LAZI IVAN, JANSSEN BART JOZEF, MILLER THOMAS G, TIEMEIJER PETER CHRISTIAAN, ROUTH, JR. BRIAN ROBERTS, FOORD DAVID

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Modeling of stress distribution on the basis of the measured values of strain and temperature changes von Jandrlić, Ivan, Rešković, Stoja, Ćurčija, Dušan, Lazić, Ladislav, Brlić, Tin

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