Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes von Ball, D. R., Hutson, J. M., Javanainen, A., Lauenstein, J.-M., Galloway, K. F., Johnson, R. A., Alles, M. L., Sternberg, A. L., Sierawski, B. D., Witulski, A. F., Reed, R. A., Schrimpf, R. D.

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Estimating Terrestrial Neutron-Induced SEB Cross Sections and FIT Rates for High-Voltage SiC Power MOSFETs von Ball, D. R., Sierawski, B. D., Galloway, K. F., Johnson, R. A., Alles, M. L., Sternberg, A. L., Witulski, A. F., Reed, R. A., Schrimpf, R. D., Javanainen, A., Lauenstein, J.-M

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Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs von Ball, D. R., Galloway, K. F., Johnson, R. A., Alles, M. L., Sternberg, A. L., Witulski, A. F., Reed, R. A., Schrimpf, R. D., Hutson, J. M., Lauenstein, J.-M.

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Evaluating Constraints on Heavy-Ion SEE Susceptibility Imposed by Proton SEE Testing and Other Mixed Environments von Ladbury, R. L., Lauenstein, J.-M

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Use of Proton SEE Data as a Proxy for Bounding Heavy-Ion SEE Susceptibility von Ladbury, R., Lauenstein, J.-M, Hayes, K. P.

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Effect of Space Radiation on Transition-Edge Sensor Detectors Performance von Beaumont, S., Lauenstein, J.-M., Adams, J.S., Bandler, S.R., Chervenak, J.A., Finkbeiner, F.M., Hull, S.V., Kelley, R.L., Kilbourne, C.A., Roch, A. Le, Muramatsu, H., Porter, F.S., Sakai, K., Smith, S.J., Wakeham, N.A., Wassell, E.J., Yoon, S.

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Response Variability in Commercial MOSFET SEE Qualification von George, J. S., Clymer, D. A., Turflinger, T. L., Mason, L. W., Stone, S., Koga, R., Beach, E., Huntington, K., Lauenstein, J-M, Titus, J., Sivertz, M.

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Impact of Ion Energy and Species on Single Event Effects Analysis von Reed, R.A., Weller, R.A., Mendenhall, M.H., Lauenstein, J.-M., Warren, K.M., Pellish, J.A., Schrimpf, R.D., Sierawski, B.D., Massengill, L.W., Dodd, P.E., Shaneyfelt, M.R., Felix, J.A., Schwank, J.R., Haddad, N.F., Lawrence, R.K., Bowman, J.H., Conde, R.

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Influence of Radiation Environment Variability on Cumulative Heavy-Ion-Induced Leakage Current in SiC Power Devices von Johnson, R. A., Witulski, A. F., Sierawski, B. D., Ball, D. R., Galloway, K. F., Sternberg, A. L., Reed, R. A., Schrimpf, R. D., Alles, M. L., Lauenstein, J. M., Hutson, J.M.

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Substance P immunoreactive nerve terminals in the dorsolateral nucleus of the tractus solitarius: roles in the baroreceptor reflex von Massari, V.John, Shirahata, Machiko, Johnson, Tannis A, Lauenstein, Jean-Marie, Gatti, Philip J

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Neural control of left ventricular contractility in the dog heart: synaptic interactions of negative inotropic vagal preganglionic neurons in the nucleus ambiguus with tyrosine hyd... von Massari, V.John, Dickerson, Linda W., Gray, Alrich L., Lauenstein, Jean-Marie, Blinder, Karen J., Newsome, Joseph T., Rodak, David J., Fleming, Terry J., Gatti, Philip J., Gillis, Richard A.

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Ultrastructural circuitry of cardiorespiratory reflexes: there is a monosynaptic path between the nucleus of the solitary tract and vagal preganglionic motoneurons controlling atri... von Blinder, Karen J., Gatti, Philip J., Johnson, Tannis A., Lauenstein, Jean-Marie, Coleman, William P., Gray, Alrich L., Massari, V.John

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Control of negative inotropic vagal preganglionic neurons in the dog: synaptic interactions with substance P afferent terminals in the nucleus ambiguus? von Blinder, Karen J.L., Dickerson, Linda W., Gray, Alrich L., Lauenstein, Jean-Marie, Newsome, Joseph T., Bingaman, Marian T., Gatti, Philip J., Gillis, Richard A., Massari, V.John

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Response Variability in Commercial MOSFET SEE Qualification von George, J. S., Clymer, D. A., Turflinger, T. L., Mason, L. W., Stone, S., Koga, R., Beach, E., Huntington, K., Lauenstein, J. -M., Titus, J., Sivertz, M.

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Effects of Ion Atomic Number on Single-Event Gate Rupture (SEGR) Susceptibility of Power MOSFETs von Lauenstein, J.-M, Goldsman, N., Liu, S., Titus, J. L., Ladbury, R. L., Kim, H. S., Phan, A. M., LaBel, K. A., Zafrani, M., Sherman, P.

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Radiation belt modeling for spacecraft design: model comparisons for common orbits von Lauenstein, J.-M., Barth, J.L.

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Statistical Analysis of Heavy-Ion Induced Gate Rupture in Power MOSFETs-Methodology for Radiation Hardness Assurance von Ferlet-Cavrois, V., Binois, C., Carvalho, A., Ikeda, N., Inoue, M., Eisener, B., Gamerith, S., Chaumont, G., Pintacuda, F., Javanainen, A., Schwank, J. R., Shaneyfelt, M. R., Lauenstein, J-M, Ladbury, R. L., Muschitiello, M., Poivey, C., Mohammadzadeh, A.

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Vagal control of left ventricular contractility is selectively mediated by a cranioventricular intracardiac ganglion in the cat von Gatti, Philip J, Johnson, Tannis A, McKenzie, James, Lauenstein, Jean-Marie, Gray, Alrich, Massari, V.John

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Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA von O'Bryan, M. V., LaBel, K. A., Pellish, J. A., Lauenstein, J.-M, Dakai Chen, Marshall, C. J., Casey, M. C., Gigliuto, R. A., Sanders, A. B., Oldham, T. R., Kim, H. S., Phan, A. M., Berg, M. D., Marshall, P. W., Ladbury, R. L., Wilcox, E. P., Boutte, A. J., Musil, P. L., Overend, G. A.

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Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems von O'Bryan, M. V., LaBel, K. A., Pellish, J. A., Lauenstein, J-M, Dakai Chen, Marshall, C. J., Oldham, T. R., Kim, H. S., Phan, A. M., Berg, M. D., Campola, M. J., Sanders, A. B., Marshall, P. W., Xapsos, M. A., Heidel, D. F., Rodbell, K. P., Swonger, J. W., Alexander, D., Gauthier, M., Gauthier, B.

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