Memory access bases on erase cycle time von Ong Wei-Kent, Yuusuke Ogiwara, Lau Sie-Wei Henry, Ong Mee-Choo

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Memory Access Bases on Erase Cycle Time von LAU SIE-WEI HENRY, ONG WEI-KENT, YUUSUKE OGIWARA, ONG MEEOO

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Design for test (DFT) read speed through transition detector in built-in self-test (BIST) sort von CH'NG SHEAU-YANG, ONG WEI-KENT, LAU SIE WEI HENRY, TEOH BOON-WENG, ONG MEEOO, BEH JIH HONG

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DESIGN FOR TEST (DFT) READ SPEED THROUGH TRANSITION DETECTOR IN BUILT-IN SELF-TEST (BIST) SORT von TEOH, BOON-WENG, ONG, WEI-KENT, ONG, MEEOO, BEH, JIH, HONG, CH'NG, SHEAU-YANG, LAU, SIE WEI, HENRY

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DESIGN FOR TEST (DFT) READ SPEED THROUGH TRANSITION DETECTOR IN BUILT-IN SELF-TEST (BIST) SORT von CH'NG SHEAU-YANG, ONG WEI-KENT, LAU SIE WEI HENRY, TEOH BOON-WENG, ONG MEEOO, BEH JIH HONG

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DESIGN FOR TEST (DFT) READ SPEED THROUGH TRANSITION DETECTOR IN BUILT-IN SELF-TEST (BIST) SORT von TEOH, BOON-WENG, CH'NG,, SHEAU-YANG, ONG, WEI-KENT, ONG, MEEOO, BEH, JIH, HONG, LAU, SIE WEI, HENRY

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