Backscattering correction for quantitative Auger analysis III. A simple functional representation of electron backscattering factors von Ichimura, S., Shimizu, R., Langeron, J.P.

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Quantitative approach of Auger electron spectrometry von Pons, F, Le Héricy, J, Langeron, J.P

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Quantitative approach of Auger electron spectrometry von Pons, F, Le Héricy, J, Langeron, J.P

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Iron diffusion from pure Fe substrate into TiN buffer layers von Grigorov, G.I., Grigorov, K.G., Stojanova, M., Vignes, J.L., Langeron, J.P., Denjean, P., Ranno, L.

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Backscattering correction for quantitative Auger analysis von Ichimura, S., Shimizu, R., Langeron, J.P.

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An important step in quantitative auger analysis: The use of peak to background ratio von Langeron, J.P., Minel, L., Vignes, J.L., Bouquet, S., Pellerin, F., Lorang, G., Ailloud, P., Le Héricy, J.

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Quantitative Auger electron spectroscopic analysis of titanium nitrides von Vignes, J.L., Langeron, J.P., Grigorov, G.I., Martev, I.N., Stoyanova, M.V.

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Backscattering correction for quantitative Auger analysis. Pt. 3:A simple functional representation of electron backscattering factors von ICHIMURA, S, SHIMIZU, R, LANGERON, J.P

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AES and ELS study of Hydrogen adsorption, Oxygen adsorption and sulphur segregation on a clean titanium surface von Pellerin, F., Langeron, J.P.

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Quantitative approach of Auger electron spectrometry: I. A formalism for the calculation of surface concentrations von Pons, F, Le Héricy, J, Langeron, J.P

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Surface composition analysis of Au-Cu alloy by micro-auger electron spectroscopy von Asahara, Y., Tokutaka, H., Nishimori, K., Ishihara, N., Makino, N., Héricy, J.Le, Langeron, J.P.

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AES and ELS study of hydrogen adsorption, oxygen adsorption and sulphur segregation on a clean titanium surface von Pellerin, F., Langeron, J.P.

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A comparative Rutherford backscattering spectrometry and Auger electron spectroscopy depth profile study of Fe-N films von De Rugy, H., Langeron, J.P., Bouquet, S., Minel, L., Grigonov, G.I., Martev, I.N.

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Comments on “AES studies of surface composition of Ag-Cu alloys” BY P. Braun and W. Färber, and on “Quantitative Auger analysis of copper-nickel alloy surfaces after argon ion bomb... von Pons, F., Le Héricy, J., Langeron, J.P.

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Surface and intergranular segregation in NiSi alloys von Lorang, G., Minel, L., Bouquet, S., Langeron, J.P.

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Quantitative approach of Auger electron spectrometry: II. Experimental part von Pons, F, Le Héricy, J, Langeron, J.P

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Lead deposition onto a polycrystalline platinum surface von Praline, G., Pacia, N., Ehrhardt, J.J., Cassuto, A., Langeron, J.P.

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The use of peak to background ratio in quantitative Auger analysis von Langeron, J.P., Minel, L., Vignes, J.L., Bouquet, S., Pellerin, F., Lorang, G., Ailloud, P., Le Héricy, J.

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Depth information in Auger electron spectroscopy von Vignes, J.L., Pellerin, F., Lorang, G., Bouquet, S., Le Héricy, J., Langeron, J.P.

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Chlorine migration under electron bombardment observed by aes von Bouquet, S., Bergner, J., Le Héricy, J., Langeron, J.P.

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