X-ray coherent scattering form factors of tissues, water and plastics using energy dispersion von King, B W, Landheer, K A, Johns, P C

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Chemical sputtering by H2 + and H3 + ions during silicon deposition von Landheer, K., Goedheer, W. J., Poulios, I., Schropp, R. E. I., Rath, J. K.

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(Invited) Conductive Bridging RAM (CBRAM): Then, Now, and Tomorrow von Jameson, John R., Blanchard, Philippe, Dinh, John, Gonzales, Nathan, Gopalakrishnan, Vasudevan, Guichet, Berenice, Hollmer, Shane, Hsu, Sue, Intrater, Gideon, Kamalanathan, Deepak, Kim, David, Koushan, Foroozan, Kwan, Ming, Lewis, Derric, Pedersen, Bård, Ramsbey, Mark, Runnion, Ed, Shields, Jeffrey, Tsai, Kevin, Tysdal, Aaron, Wang, Daniel, Gopinath, Venkatesh

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(Invited) Xenes: A New Emerging Two-Dimensional Materials Platform for Nanoelectronics von Molle, Alessandro

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(Invited) Ferroelectric Hafnium Oxide Based Materials and Devices: Assessment of Current Status and Future Prospects von Müller, Johannes, Polakowski, Patrick, Müller, Stefan, Mikolajick, Thomas

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EP-1796: Template-based commissioning model for in vivo EPID transit dosimetry von Landheer, K., Van Oers, R., Olaciregui-Ruiz, I., Mans, A.

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(Invited) Mobile Ions, Transport and Redox Processes in Memristive Devices von Valov, Ilia, Luebben, Michael, Wedig, Anja, Waser, Rainer

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Constrained Source Space MR Spectroscopy: Multiple Voxels, No Gradient Readout von Landheer, K, Sahgal, A, Das, S, Graham, S J

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Silicene Nanoribbon Tunnel Field Effect Transistor von Fahad, Md S, Srivastava, Ashok, Sharma, Ashwani K, Mayberry, Clay, Mohsin, K M

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Across‐vendor standardization of semi‐LASER for single‐voxel MRS at 3T von Deelchand, Dinesh K., Berrington, Adam, Noeske, Ralph, Joers, James M., Arani, Arvin, Gillen, Joseph, Schär, Michael, Nielsen, Jon‐Fredrik, Peltier, Scott, Seraji‐Bozorgzad, Navid, Landheer, Karl, Juchem, Christoph, Soher, Brian J., Noll, Douglas C., Kantarci, Kejal, Ratai, Eva M., Mareci, Thomas H., Barker, Peter B., Öz, Gülin

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Current Coupling Effect in MIS Tunnel Diode with Coupled Open-Gated MIS Structure von Liao, Chien-Shun, Hwu, Jenn-Gwo

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(Invited) Evaluation of Few-Layer MoS2 Transistors with a Top Gate and HfO2 Dielectric von Young, Chadwin D, Zhao, Peng, Bolshakov-Barrett, Pavel, Azcatl, Angelica, Hurley, P. K., Gomeniuk, Y. Y., Schmidt, Michael, Hinkle, Christopher L, Wallace, Robert M

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Note: Laser-cut molybdenum grids for a retarding field energy analyzer von Landheer, K., Kobelev, A. A., Smirnov, A. S., Bosman, J., Deelen, S., Rossewij, M., de Waal, A. C., Poulios, I., Benschop, A. F., Schropp, R. E. I., Rath, J. K.

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Conductive AFM Topography of Intrinsic Conductivity Variations in Silica Based Dielectrics for Memory Applications von Buckwell, Mark, Zarudnyi, Konstantin, Montesi, Luca, Ng, Wing Hung, Hudziak, Stephen, Mehonic, Adnan, Kenyon, Anthony Joseph

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(Invited) Internal Photoemission of Electrons from 2-Dimensional Semiconductors von Afanas'ev, Valery V., Chiappe, Daniele, Leonhardt, Alessandra, Houssa, Michel, Huyghebaert, Cedric, Radu, Iuliana, Stesmans, Andre

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(Invited) Mechanism of Low Temperature ALD of Al2O3 on Graphene Terraces von Kwak, Iljo, Park, Jun Hong, Grissom, Larry, Fruhberger, Bernd, Kummel, Andrew

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SU‐E‐I‐187: Coherent Scatter Ring Integration Imaging von Landheer, K, Johns, P C

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Selected Success Stories from Twenty Years of High-k Gate Dielectric Research von Kar, Samares

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Oxygen Polyvacancies as Conductive Filament in Zirconia: First Principle Simulation von Perevalov, Timofey V., Islamov, Damir R.

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Selective-Area Growth of Vertical InGaAs Nanowires on Ge for Transistor Applications von Yoshida, Akinobu, Tomioka, Katsuhiro, Ishizaka, Fumiya, Chiba, Kohei, Motohisa, Junichi

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