An Experimental Analysis of Power and Delay Signal-to-Noise Requirements for Detecting Trojans and Methods for Achieving the Required Detection Sensitivities von Lamech, Charles, Rad, Reza M., Tehranipoor, Mohammad, Plusquellic, Jim

Volltext

Within-Die Delay Variation Measurement and Power Transient Analysis Using REBEL von Saqib, Fareena, Ismari, Dylan, Lamech, Charles, Plusquellic, Jim

Volltext

A transmission gate physical unclonable function and on-chip voltage-to-digital conversion technique von Chakraborty, Raj, Lamech, Charles, Acharyya, Dhruva, Plusquellic, Jim

Volltext

Trojan detection based on delay variations measured using a high-precision, low-overhead embedded test structure von Lamech, C., Plusquellic, J.

Volltext bestellen

Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect von Aarestad, Jim, Lamech, Charles, Plusquellic, Jim, Acharyya, Dhruva, Agarwal, Kanak

Volltext

REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations von Lamech, C., Aarestad, J., Plusquellic, J., Rad, R., Agarwal, K.

Volltext