Cold neutron depth profiling of lithium-ion battery materials von Lamaze, G.P, Chen-Mayer, H.H, Becker, D.A, Vereda, F, Goldner, R.B, Haas, T, Zerigian, P

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Conduction processes in boron- and nitrogen-doped diamond-like carbon films prepared by mass-separated ion beam deposition von Ronning, C., Griesmeier, U., Gross, M., Hofsäss, H.C., Downing, R.G., Lamaze, G.P.

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Neutron depth profiling: overview and description of NIST facilities von DOWNING, R. G, LAMAZE, G. P, LANGLAND, J. K, HWANG, S. T

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Retention and surface blistering of helium irradiated tungsten as a first wall material von Gilliam, S.B., Gidcumb, S.M., Parikh, N.R., Forsythe, D.G., Patnaik, B.K., Hunn, J.D., Snead, L.L., Lamaze, G.P.

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Helium retention and surface blistering characteristics of tungsten with regard to first wall conditions in an inertial fusion energy reactor von Gilliam, S.B., Gidcumb, S.M., Forsythe, D., Parikh, N.R., Hunn, J.D., Snead, L.L., Lamaze, G.P.

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Analysis of boron in CVD diamond surfaces using neutron depth profiling von Lamaze, G.P., Downing, R.G., Pilione, L., Badzian, A., Badzian, T.

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New thermal neutron prompt γ-ray activation analysis instrument at the National Institute of Standards and Technology Center for Neutron Research von Mackey, E.A., Anderson, D.L., Liposky, P.J., Lindstrom, R.M., Chen-Mayer, H., Lamaze, G.P.

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Analyses of thin films and surfaces by cold neutron depth profiling von Lamaze, G.P., Chen-Mayer, H.H., Soni, K.K.

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Two aspects of thin film analysis: boron profile and scattering length density profile von Chen-Mayer, H.H., Lamaze, G.P., Coakley, K.J., Satija, S.K.

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Erratum to “Modeling detector response for Neutron Depth Profiling” [Nucl. Instr. and Meth. A 366 (1995) 137] von Coakley, K.J., Downing, R.G., Lamaze, G.P., Hofsass, H.C., Ronning, C., Biegel, J.

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A high efficiency device for the detection of radioactive xenon isotopes von Lamaze, G.P.

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Characterization of a cold neutron beam from a curved guide von Mildner, D.F.R., Chen-Mayer, H.H., Lamaze, G.P., Sharov, V.A.

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Calibration of a stopping power model for silicon based on analysis of neutron depth profiling and secondary ion mass spectrometry measurements von Coakley, K.J, Chen-Mayer, H.H, Lamaze, G.P, Simons, D.S, Thompson, P.E

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Measurement of the neutron lifetime by counting trapped protons von BYRNE, J, DAWBER, P. G, EYKENS, R, LAMBERTY, A, SPAIN, J. A, WILLIAMS, A. P, DEWEY, M. S, GILLIAM, D. M, GREENE, G. L, LAMAZE, G. P, SCOTT, R. D, PAUWELS, J

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Modeling detector response for neutron depth profiling von Coakley, K.J, Downing, R.G, Lamaze, G.P, Hofsäss, H.C, Biegel, J, Ronning, C

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Analysis of cubic boron nitride thin films by neutron depth profiling von Lamaze, G.P., Downing, R.G., Hackenberger, L.B., Pilione, L.J., Messier, R.

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Mass assay and uniformity tests of boron targets by neutron beam methods von Gilliam, D.M., Lamaze, G.P., Dewey, M.S., Greene, G.L.

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Absolute neutron counting based on B-10 alpha-gamma coincidence methods von Gilliam, D.M., Greene, G.L., Lamaze, G.P.

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Determination of the neutron lifetime by counting trapped protons von Byrne, J., Dawber, P.G., Spain, J.A., Dewey, M.S., Gilliam, D.M., Greene, G.L., Lamaze, G.P., Williams, A.P., Pauwels, J., Eykens, R., VanGestel, J., Lamberty, A., Scott, R.D.

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An angular correlation study of the low-lying levels of 29P von Lamaze, G.P., Gould, C.R., Moss, C.E., Roberson, N.R., Tilley, D.R.

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