Si ion implantation of SrTiO3passivated YBa2Cu3O6+x films for multilayer processing of electronic circuits von LaGraff, J.R, Pan, G.Z, Tu, K.N

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Si ion implantation of SrTiO 3passivated YBa 2Cu 3O 6+ x films for multilayer processing of electronic circuits von LaGraff, J.R, Pan, G.Z, Tu, K.N

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Local Cross-sectional Profiling of Multilayer Thin Films with an Atomic Force Microscope for Layer Thickness Determination von LaGraff, J. R., Murduck, J. M.

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Enhanced Electrochemical Deposition with an Atomic Force Microscope von LaGraff, John R, Gewirth, Andrew A

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Nanometer-Scale Mechanism for the Constructive Modification of Cu Single Crystals and Alkanethiol Passivated Au(111) with an Atomic Force Microscope von LaGraff, John R., Gewirth, Andrew A.

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Electrical measurements near the orthorhombic-tetragonal phase transformation in single crystal YBa 2Cu 3O 7−δ von Lagraff, J.R., Han, P.D., Payne, D.A.

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Electrical measurements near the orthorhombic-tetragonal phase transformation in single crystal YBa2Cu3O7−δ von Lagraff, J.R., Han, P.D., Payne, D.A.

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Resistance measurements and oxygen out-diffusion near the orthorhombic-tetragonal phase transformation in single-crystal YBa sub 2 Cu sub 3 O sub 7 minus. delta von LaGraff, J.R., Han, P.D., Payne, D.A.

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Normal state electrical measurements near the ferroelastic phase transformation in single crystal YBa/sub 2/Cu/sub 3/O/sub 7- delta von LaGraff, J.R., Han, P.D., Payne, D.A.

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