Multi-scale dynamics at the glassy silica surface von Nguyen, Huy A., Liao, Can, Wallum, Alison, Lyding, J., Gruebele, M.

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Inducing Electronic Changes in Graphene through Silicon (100) Substrate Modification von Xu, Y, He, K. T, Schmucker, S. W, Guo, Z, Koepke, J. C, Wood, J. D, Lyding, J. W, Aluru, N. R

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Plasmonic support-mediated activation of 1 nm platinum clusters for catalysis von Wieghold, S, Nienhaus, L, Knoller, F L, Schweinberger, F F, Shepherd, J J, Lyding, J W, Heiz, U, Gruebele, M, Esch, F

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Temperature-dependent two-state dynamics of individual cooperatively rearranging regions on a glass surface von Ashtekar, S, Lyding, J, Gruebele, M

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Atomic-Scale Desorption Through Electronic and Vibrational Excitation Mechanisms von T.-C. Shen, Wang, C., Abeln, G. C., Tucker, J. R., Lyding, J. W., Ph. Avouris, Walkup, R. E.

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Silicon-based molecular nanotechnology von Hersam, M C, Guisinger, N P, Lyding, J W

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Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography von Schmucker, S.W., Kumar, N., Abelson, J.R., Daly, S.R., Girolami, G.S., Bischof, M.R., Jaeger, D.L., Reidy, R.F., Gorman, B.P., Alexander, J., Ballard, J.B., Randall, J.N., Lyding, J.W.

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Direct imaging of two-state dynamics on the amorphous silicon surface von Ashtekar, S, Scott, G, Lyding, J, Gruebele, M

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Ultrahigh-vacuum scanning tunneling microscopy and spectroscopy of single-walled carbon nanotubes on hydrogen-passivated Si(100) surfaces von Albrecht, P. M., Lyding, J. W.

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Communication: An obligatory glass surface von Ashtekar, S, Nguyen, D, Zhao, K, Lyding, J, Wang, W H, Gruebele, M

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Reduction of hot electron degradation in metal oxide semiconductor transistors by deuterium processing von Lyding, J. W., Hess, K., Kizilyalli, I. C.

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Atomic precision patterning on Si: An opportunity for a digitized process von Randall, J.N., Ballard, J.B., Lyding, J.W., Schmucker, S., Von Ehr, J.R., Saini, R., Xu, H., Ding, Y.

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Breaking individual chemical bonds via STM-induced excitations von Avouris, Ph, Walkup, R.E., Rossi, A.R., Akpati, H.C., Nordlander, P., Shen, T.-C., Abeln, G.C., Lyding, J.W.

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Atom-resolved three-dimensional mapping of boron dopants in Si(100) by scanning tunneling microscopy von Liu, Lequn, Yu, Jixin, Lyding, J. W.

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Cryogenic UHV-STM Study of Hydrogen and Deuterium Desorption from Si(100) von Foley, E. T., Kam, A. F., Lyding, J. W., Avouris, Ph

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Giant isotope effect in hot electron degradation of metal oxide silicon devices von Hess, K., Kizilyalli, I.C., Lyding, J.W.

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Deuterium post-metal annealing of MOSFET's for improved hot carrier reliability von Kizilyalli, I.C., Lyding, J.W., Hess, K.

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Isolating, imaging, and electrically characterizing individual organic molecules on the Si(100) surface with the scanning tunneling microscope von Hersam, M. C., Guisinger, N. P., Lyding, J. W.

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On the mechanism for interface trap generation in MOS transistors due to channel hot carrier stressing von Zhi Chen, Karl Hess, Jinju Lee, Lyding, J.W., Rosenbaum, E., Kizilyalli, I., Chetlur, S., Huang, R.

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Atomic resolution scanning tunneling microscope study of single-walled carbon nanotubes on GaAs(110) von Ruppalt, L. B., Albrecht, P. M., Lyding, J. W.

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