The impact of TiN capping layer on NiSi, CoSi2, and CoxNi1-xSi2 FUSI metal gate work function adjustment von JUN LIU, WEN, Huang-Chun, LU, Jiong-Ping, KWONG, Dim-Lee

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Solution precursor chemical vapor deposition of titanium oxide thin films von Lu, Jiong-Ping, Wang, Jenqdaw, Raj, Rishi

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The impact of TiN capping Layer on NiSi, CoSi/sub 2/, and Co/sub x/Ni/sub 1-x/Si/sub 2/ FUSI metal gate work function adjustment von Liu, Jun, Wen, Huang-Chun, Lu, Jiong-Ping, Kwong, Dim-Lee

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Decomposition of methanol on oxygen-modified Fe(100) surfaces: II. Preadsorbed oxygen as poison, selectivity modifier and promoter von Lu, Jiong-Ping, Albert, Mark, Bernasek, Steven L., Dwyer, Daniel J.

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Ultrahigh vacuum chemical vapor deposition of rhodium thin films on clean and TiO2-covered Si(111) von Lu, Jiong-Ping, Chu, Polly W., Raj, Rishi, Gysling, Henry

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Ultra-high vacuum metalorganic chemical vapor deposition of GaAs thin films onto Si(100) using a single-source precursor von Lu, Jiong-Ping, Raj, Rishi, Wernberg, Alex

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Characterization of reactions at titanium/nickel silicide interface using X-ray photoelectron spectroscopy and transmission electron microscopy von Zhao, Jin, Lu, Jiong-Ping, Xu, Yu-Qing, Kuan, Yu-Ji R, Tsung, Lancy

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Decomposition of methanol on oxygen-modified Fe(100) surfaces: I. The effect of high temperature oxygen modification von Lu, Jiong-Ping, Albert, Mark, Bernasek, Steven L., Dwyer, Daniel S.

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Integrated barrier/plug fill schemes for high aspect ratio Gb DRAM contact metallization von Chen, Yu-Pei, Dixit, Girish A, Lu, Jiong-Ping, Hsu, Wei-Yung, Konecni, Anthony J, Luttmer, J.D, Havemann, Robert H

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Millisecond anneal for ultra-shallow junction applications von Jiong-Ping Lu, Yonggen He, Yong Chen

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Surface reactions of dimethylaminoarsine during MOMBE of GaAs von Salim, Sateria, Ping Lu, Jiong, Jensen, Klavs F., Bohling, David A.

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Investigation of Ni-based silicide formation by different dynamic surface annealing approaches von Yonggen He, Bing Wu, Guobin Yu, Jin Lin, Zhang, S, Jiong-Ping Lu, Jingang Wu, JiYue Tang, Ganming Zhao

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Laser spike anneal macro & micro non-uniformity investigation using modulated optical reflectance and four-point-probe von Yonggen He, Yong Chen, Guobin Yu, Hong, Albert, Jiong-Ping Lu, Xianghua Liu, Lu Yu, Yue Chen

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The impact of TiN capping Layer on NiSi, CoSi(2), and Co(x)Ni(1-x)Si(2) FUSI metal gate work function adjustment von Liu, Jun, Wen, Huang-Chun, Lu, Jiong-Ping, Kwong, Dim-Lee

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The impact of TiN capping Layer on NiSi, CoSi sub(2), and Co sub(x)Ni sub(1-x)Si sub( 2) FUSI metal gate work function adjustment von Liu, Jun, Wen, Huang-Chun, Lu, Jiong-Ping, Kwong, Dim-Lee

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Effects of postdosed species on preadsorbed CO on Fe(100) : adsorption site conversion caused by site competition von JIONG-PING LU, ALBERT, M. R, BERNASEK, S. L

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Relaxation-Induced Excess Leakage Current in Recessed Si 1-x Ge x Source/Drain Junctions von Gonzalez, Mireia B., Chowdhury, Mohammad Kamruzzaman, Bhouri, Nada, Verheyen, Peter, Leys, Frederik, Richard, Olivier, Loo, Roger, Claeys, Cor, Simoen, Eddy, Machkaoutsan, Vladimir, Tomasini, Pierre, Thomas, Shawn, Lu, Jiong Ping, Weijtmans, J.W, Wise, R.

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Analysis of the Pre-epi Bake Conditions on the Defect Creation in Recessed SiGe S/D Junctions von Bargallo Gonzalez, Mireia, Thomas, Nicole, Simoen, Eddy, Verheyen, Peter, Hikavyy, Andriy, Leys, Frederik, Okuno, Yasutoshi, Vissouvanadin Soubaretty, Bertrand, Van Daele, Benny, Geenen, Luc, Loo, Roger, Claeys, C., Machkaoutsan, Vladimir, Tomasini, Pierre, Thomas, Shawn, Ping Lu, Jiong, Weijtmans, J.W., Wise, Rick

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Semiconductor device having a silicided gate electrode and method of manufacture therefor von Lu, Jiong-Ping

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Method for improving the thermal stability of silicide von Lu, Jiong-Ping, Xu, Jiejie

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