Embedded 1-Mb ReRAM-Based Computing-in- Memory Macro With Multibit Input and Weight for CNN-Based AI Edge Processors von Xue, Cheng-Xin, Chang, Ting-Wei, Chang, Tung-Cheng, Kao, Hui-Yao, Chiu, Yen-Cheng, Lee, Chun-Ying, King, Ya-Chin, Lin, Chrong-Jung, Liu, Ren-Shuo, Hsieh, Chih-Cheng, Tang, Kea-Tiong, Chen, Wei-Hao, Chang, Meng-Fan, Liu, Je-Syu, Li, Jia-Fang, Lin, Wei-Yu, Lin, Wei-En, Wang, Jing-Hong, Wei, Wei-Chen, Huang, Tsung-Yuan

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On-Wafer FinFET-Based 3-D E-Beam Detector Cube for In Situ Monitoring of Advanced Lithography Processes Beyond 5 nm von Teng, Yu-Jie, Chao, Ho-Ting, Chang, Wei, Jeng Lin, Burn, Chih, Yue-Der, Chang, Jonathan, Jung Lin, Chrong, King, Ya-Chin

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3-D Stackable Offset-Via Antifuse by Cu BEOL Process in Advanced CMOS Technologies von Yeh, Li-Yu, Chang, Ya-Lin, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong-Jung, King, Ya-Chin

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A Contact-Resistive Random-Access-Memory-Based True Random Number Generator von HUANG, Chien-Yuan, WEN CHAO SHEN, TSENG, Yuan-Heng, KING, Ya-Chin, LIN, Chrong-Jung

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Multilevel Fully Logic-Compatible Latch Array for Computing-in-Memory von Yeh, Ming-Shyue, Wang, Ya-Ching, Huang, Yao-Hung, Shih, Jiaw-Ren, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong-Jung, King, Ya-Chin

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High-density via RRAM cell with multi-level setting by current compliance circuits von Hsieh, Yu-Cheng, Lin, Yu-Cheng, Huang, Yao-Hung, Chih, Yu-Der, Chang, Jonathan, Lin, Chrong-Jung, King, Ya-Chin

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Test Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes von Su, Chi, Tsai, Yi-Pei, Lin, Chrong-Jung, King, Ya-Chin

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Self-Convergent Trimming SRAM True Random Number Generation With In-Cell Storage von Yeh, Po-Shao, Yang, Chih-An, Chang, Yi-Hong, Chih, Yue-Der, Lin, Chrong-Jung, King, Ya-Chin

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A ReRAM-Based Nonvolatile Flip-Flop With Self-Write-Termination Scheme for Frequent-OFF Fast-Wake-Up Nonvolatile Processors von Lee, Albert, Chieh-Pu Lo, Chien-Chen Lin, Wei-Hao Chen, Kuo-Hsiang Hsu, Zhibo Wang, Fang Su, Zhe Yuan, Qi Wei, Ya-Chin King, Chrong-Jung Lin, Hochul Lee, Amiri, Pedram Khalili, Kang-Lung Wang, Yu Wang, Huazhong Yang, Yongpan Liu, Meng-Fan Chang

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Application of twin-bit self-rectifying via RRAM with unique diode state in cross-bar arrays by advanced CMOS Cu BEOL process von Lin, Yu-Cheng, Huang, Yao-Hung, Chuang, Kai-Ching, Chih, Yu-Der, Chang, Jonathan, Lin, Chrong-Jung, King, Ya-Chin

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Wide range detector of plasma induced charging effect for advanced CMOS BEOL processes von Chao, Yi-Jie, Yang, Kai-Wei, Su, Chi, Lin, Chrong-Jung, King, Ya-Chin

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Antifuse OTP Cell in a Cross-Point Array by Advanced CMOS FinFET Process von Kuo, Ren-Jay, Chang, Fu-Cheng, King, Ya-Chin, Lin, Chrong-Jung

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Advanced self-convergent calibration for selenized two-dimensional film gas sensors von Liu, Che-Chuan, Shen, Hsin-Yi, Wang, Kuangye, Chueh, Yu-Lun, Chih, Yue-Der, Chang, Jonathan, Shih, Jiaw-Ren, Lin, Chrong-Jung, King, Ya-Chin

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Design and optimization of multiple-time programmable memory cell by advanced CMOS FinFET technologies von Chuang, Chun-Yu, Lin, Chrong-Jung, King, Ya-Chin

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A ReRAM Macro Using Dynamic Trip-Point-Mismatch Sampling Current-Mode Sense Amplifier and Low-DC Voltage-Mode Write-Termination Scheme Against Resistance and Write-Delay Variation von Lo, Chieh-Pu, Lin, Wen-Zhang, Lin, Wei-Yu, Lin, Huan-Ting, Yang, Tzu-Hsien, Chiang, Yen-Ning, King, Ya-Chin, Lin, Chrong-Jung, Chih, Yu-Der, Chang, Tsung-Yung Jonathon, Chang, Meng-Fan

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Embedded Micro-detectors for EUV Exposure Control in FinFET CMOS Technology von Wang, Chien-Ping, Lin, Burn Jeng, Wu, Pin-Jiun, Shih, Jiaw-Ren, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong Jung, King, Ya-Chin

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A Study of the Variability in Contact Resistive Random Access Memory by Stochastic Vacancy Model von Kao, Yun-Feng, Zhuang, Wei Cheng, Lin, Chrong-Jung, King, Ya-Chin

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An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array von Kao, Yun-Feng, Shih, Jiaw-Ren, Lin, Chrong Jung, King, Ya-Chin

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Detectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology von Wang, Chien-Ping, Lin, Burn Jeng, Shih, Jiaw-Ren, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong Jung, King, Ya-Chin

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Dynamic pH Sensor with Embedded Calibration Scheme by Advanced CMOS FinFET Technology von Wang, Chien-Ping, Shen, Ying-Chun, Liou, Peng-Chun, Chueh, Yu-Lun, Chih, Yue-Der, Chang, Jonathan, Lin, Chrong-Jung, King, Ya-Chin

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