A Study of Diagnostic Accuracy Using a Chemical Sensor Array and a Machine Learning Technique to Detect Lung Cancer von Huang, Chi-Hsiang, Zeng, Chian, Wang, Yi-Chia, Peng, Hsin-Yi, Lin, Chia-Sheng, Chang, Che-Jui, Yang, Hsiao-Yu

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Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor von Chen, Te-Chih, Chang, Ting-Chang, Hsieh, Tien-Yu, Lu, Wei-Siang, Jian, Fu-Yen, Tsai, Chih-Tsung, Huang, Sheng-Yao, Lin, Chia-Sheng

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Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress von Chen, Te-Chih, Chang, Ting-Chang, Tsai, Chih-Tsung, Hsieh, Tien-Yu, Chen, Shih-Ching, Lin, Chia-Sheng, Hung, Ming-Chin, Tu, Chun-Hao, Chang, Jiun-Jye, Chen, Po-Lun

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The Mitigators of Ad Irritation and Avoidance of YouTube Skippable In-Stream Ads: An Empirical Study in Taiwan von Lin, Hota Chia-Sheng, Lee, Neil Chueh-An, Lu, Yi-Chieh

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NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain von LIN, Chia-Sheng, CHEN, Ying-Chung, SHIH, Jou-Miao, CHANG, Ting-Chang, JIAN, Fu-Yen, HSU, Wei-Che, KUO, Yuan-Jui, DAI, Chih-Hao, CHEN, Te-Chih, LO, Wen-Hung, HSIEH, Tien-Yu

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A Novel Constraints Model of Credibility-Fuzzy for Reliability Redundancy Allocation Problem by Simplified Swarm Optimization von Lin, Hota Chia-Sheng, Huang, Chia-Ling, Yeh, Wei-Chang

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Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors under Hot-Carrier Stress von Chung, Wan-Fang, Chang, Ting-Chang, Lin, Chia-Sheng, Tu, Kuan-Jen, Li, Hung-Wei, Tseng, Tseung-Yuen, Chen, Ying-Chung, Tai, Ya-Hsiang

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Effect of N2O plasma treatment on the improvement of instability under light illumination for InGaZnO thin-film transistors von HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, TSAI, Ming-Yen, LU, Wei-Hsiang, CHEN, Shih-Cheng, JIAN, Fu-Yen, LIN, Chia-Sheng

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Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments von HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, TSAI, Ming-Yen, CHEN, Yu-Te, JIAN, Fu-Yen, LIN, Chia-Sheng, TSAI, Wu-Wei, CHIANG, Wen-Jen, YAN, Jing-Yi

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A New Technique to Increase Reliability in Measuring the Axis of Bone von Lin, Chia-Sheng, MD, Wu, Tai-Yin, MD, PhD, Wang, Ting-Ming, MD, PhD, Hou, Sheng-Mou, MD, MPH, PhD, Shih, Kao-Shang, MD, PhD, Liaw, Chen-Kun, MD, PhD

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Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition von Chen, Te-Chih, Chang, Ting-Chang, Hsieh, Tien-Yu, Tsai, Chih-Tsung, Chen, Shih-Ching, Lin, Chia-Sheng, Hung, Ming-Chin, Tu, Chun-Hao, Chang, Jiun-Jye, Chen, Po-Lun

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Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress von Lin, Chia-Sheng, Chen, Ying-Chung, Chang, Ting-Chang, Jian, Fu-Yen, Li, Hung-Wei, Chen, Yi-Chuan, Chen, Te-Chih, Tai, Ya-Hsiang

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Learning and diagnosis of individual and class conceptual perspectives: an intelligent systems approach using clustering techniques von Cheng, Shein-Yung, Lin, Chia-Sheng, Chen, Hsien-Hsun, Heh, Jia-Sheng

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Effect of Lateral Body Terminal on Silicon-Oxide-Nitride-Oxide-Silicon Thin-Film Transistors von LI, Hung-Wei, CHANG, Ting-Chang, CHANG, Geng-Wei, LIN, Chia-Sheng, TSAI, Tsung-Ming, JIAN, Fu-Yen, TAI, Ya-Hsiang, LEE, Ming-Hsien

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Anomalous Capacitance Induced by GIDL in P-Channel LTPS TFTs von LIN, Chia-Sheng, CHEN, Ying-Chung, CHANG, Ting-Chang, CHEN, Shih-Ching, JIAN, Fu-Yen, LI, Hung-Wei, CHEN, Te-Chih, WENG, Chi-Feng, JIN LU, HSU, Wei-Che

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Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier Operation von CHEN, Te-Chih, CHANG, Ting-Chang, CHEN, Shih-Ching, HSIEH, Tien-Yu, JIAN, Fu-Yen, LIN, Chia-Sheng, LI, Hung-Wei, LEE, Ming-Hsien, CHEN, Jim-Shone, SHIH, Ching-Chieh

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Improvement of Memory State Misidentification Caused by Trap-Assisted GIDL Current in a SONOS-TFT Memory Device von CHEN, Te-Chih, CHANG, Ting-Chang, JIAN, Fu-Yen, CHEN, Shih-Ching, LIN, Chia-Sheng, LEE, Ming-Hsien, CHEN, Jim-Shone, SHIH, Ching-Chieh

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Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias Stress von LIN, Chia-Sheng, CHEN, Ying-Chung, CHEN, Jim-Shone, CHANG, Ting-Chang, JIAN, Fu-Yen, LI, Hung-Wei, CHEN, Shih-Ching, CHUANG, Ying-Shao, CHEN, Te-Chih, TAI, Ya-Hsiang, LEE, Ming-Hsien

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Using dual plasma treatment to improve electrical characteristics and reduce flicker noise of high-κ HfO2 LTPS-TFTs von Chang, Kow-Ming, Huang, Bo-Wen, Wu, Chien-Hung, Deng, I-Chung, Chang, Ting-Chia, Lin, Sheng-Chia

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Analyzing the effects of ambient dependence for InGaZnO TFTs under illuminated bias stress von CHEN, Te-Chih, CHANG, Ting-Chang, HSIEH, Tien-Yu, TSAI, Ming-Yen, TSAI, Chih-Tsung, CHEN, Shih-Ching, LIN, Chia-Sheng, JIAN, Fu-Yen

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