Multi-resonance frequency spin dependent charge pumping and spin dependent recombination - applied to the 4H-SiC/SiO2 interface von Anders, M. A., Lenahan, P. M., Lelis, A. J.

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Structure, bonding, and passivation of single carbon-related oxide hole traps near 4H-SiC/SiO2 interfaces von Ettisserry, D. P., Goldsman, N., Akturk, A., Lelis, A. J.

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Are dangling bond centers important interface traps in 4H-SiC metal oxide semiconductor field effect transistors? von Anders, M. A., Lenahan, P. M., Lelis, A. J.

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Negative bias-and-temperature stress-assisted activation of oxygen-vacancy hole traps in 4H-silicon carbide metal-oxide-semiconductor field-effect transistors von Ettisserry, D. P., Goldsman, N., Akturk, A., Lelis, A. J.

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An electrically detected magnetic resonance study of performance limiting defects in SiC metal oxide semiconductor field effect transistors von Cochrane, C. J., Lenahan, P. M., Lelis, A. J.

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Identification of a silicon vacancy as an important defect in 4H SiC metal oxide semiconducting field effect transistor using spin dependent recombination von Cochrane, C. J., Lenahan, P. M., Lelis, A. J.

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Electrically detected magnetic resonance study of barium and nitric oxide treatments of 4H-SiC metal-oxide-semiconductor field-effect transistors von Ashton, J. P., Lenahan, P. M., Lichtenwalner, D. J., Lelis, A. J., Anders, M. A.

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Effects of lactic acid-producing bacteria as direct-fed microbials on the ruminal microbiome von Monteiro, H.F., Lelis, A.L.J., Fan, P., Calvo Agustinho, B., Lobo, R.R., Arce-Cordero, J.A., Dai, X., Jeong, K.C., Faciola, A.P.

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Spin dependent charge pumping in SiC metal-oxide-semiconductor field-effect-transistors von Bittel, B. C., Lenahan, P. M., Ryan, J. T., Fronheiser, J., Lelis, A. J.

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Effects of lipopolysaccharide dosing on bacterial community composition and fermentation in a dual-flow continuous culture system von Dai, X., Paula, E.M., Lelis, A.L.J., Silva, L.G., Brandao, V.L.N., Monteiro, H.F., Fan, P., Poulson, S.R., Jeong, K.C., Faciola, A.P.

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A Study of High Temperature DC and AC Gate Stressing on the Performance and Reliability of Power SiC MOSFETs von Green, Ronald, Lelis, A.J., Habersat, Daniel B., El, M.

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Effects of replacing canola meal with solvent-extracted camelina meal on microbial fermentation in a dual-flow continuous culture system von Brandao, V.L.N., Silva, L.G., Paula, E.M., Monteiro, H.F., Dai, X., Lelis, A.L.J., Faccenda, A., Poulson, S.R., Faciola, A.P.

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Temperature-Dependence of SiC MOSFET Threshold-Voltage Instability von Lelis, Aivars J., Goldsman, Neil, Green, Ronald, Habersat, Daniel B.

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Time dependence of switching oxide traps von Lelis, A.J., Oldham, T.R.

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Impacts of adding functional oils or sodium monensin in high-concentrate diets on performance, feeding behaviour and rumen morphometrics of finishing Nellore cattle von Melo, A. C. B., Pereira, M. C. S., Rigueiro, A. L. N., Estevam, D. D., Toledo, A. F., Assumpção, A. H. P. M., Dellaqua, J. V. T., Lelis, A. L. J., Millen, D. D.

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Effect of ON-State Stress on SiC DMOSFET Subthreshold I-V Characteristics von Lelis, Aivars J., Goldsman, Neil, Green, Ronald, Habersat, Daniel B.

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Bias Stress-Induced Threshold-Voltage Instability of SiC MOSFETs von Lelis, Aivars J., Goldsman, Neil, McGarrity, J.M., McLean, F. Barry, Habersat, Daniel B., Lopez, G.

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The Effect of Nitridation on SiC MOS Oxides as Evaluated by Charge Pumping von Lelis, Aivars J., McGarrity, J.M., Potbhare, Siddharth, McLean, F. Barry, Habersat, Daniel B.

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Time Dependence of Bias-Stress-Induced SiC MOSFET Threshold-Voltage Instability Measurements von Lelis, A.J., Habersat, D., Green, R., Ogunniyi, A., Gurfinkel, M., Suehle, J., Goldsman, N.

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The nature of the trapped hole annealing process von Lelis, A.J., Oldham, T.R., Boesch, H.E., McLean, F.B.

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