Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors von Chen, Chih-Yang, Lee, Jam-Wem, Wang, Shen-De, Shieh, Ming-Shan, Lee, Po-Hao, Chen, Wei-Cheng, Lin, Hsiao-Yi, Yeh, Kuan-Lin, Lei, Tan-Fu

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Low-Temperature Polycrystalline Silicon Thin-Film Flash Memory With Hafnium Silicate von LIN, Yu-Hsien, CHIEN, Chao-Hsin, CHOU, Tung-Huan, CHAO, Tien-Sheng, LEI, Tan-Fu

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Novel two-bit HfO2 nanocrystal nonvolatile flash memory von LIN, Yu-Hsien, CHIEN, Chao-Hsin, LIN, Ching-Tzung, CHANG, Chun-Yen, LEI, Tan-Fu

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Two-Bit Lanthanum Oxide Trapping Layer Nonvolatile Flash Memory von Lin, Yu-Hsien, Chien, Chao-Hsin, Yang, Tsung-Yuan, Lei, Tan-Fu

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Channel Film Thickness Effect of Low-Temperature Polycrystalline-Silicon Thin-Film Transistors von Ma, William Cheng-Yu, Tsung-Yu Chiang, Chi-Ruei Yeh, Tien-Sheng Chao, Tan-Fu Lei

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High-performance nonvolatile HfO2 nanocrystal memory von LIN, Yu-Hsien, CHIEN, Chao-Hsin, LIN, Ching-Tzung, CHANG, Chun-Yen, LEI, Tan-Fu

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Switching Mode and Mechanism in Binary Oxide Resistive Random Access Memory Using Ni Electrode von Lin, Kuan-Liang, Hou, Tuo-Hung, Lee, Yao-Jen, Chang, Jhe-Wei, Lin, Jun-Hung, Shieh, Jiann, Chou, Cheng-Tung, Lei, Tan-Fu, Chang, Wen-Hsiung, Jang, Wen-Yueh, Lin, Chen-Hsi

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Characteristics of Self-Aligned Si/Ge T-Gate Poly-Si Thin-Film Transistors With High on/off Current Ratio von Kuo, Po-Yi, Chao, Tien-Sheng, Hsieh, Pei-Shan, Lei, Tan-Fu

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Sol-gel-derived double-layered nanocrystal memory von Ko, Fu-Hsiang, You, Hsin-Chiang, Lei, Tan-Fu

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Physical Characterization and Electrical Properties of Sol-Gel-Derived Zirconia Films von You, Hsin-Chiang, Ko, Fu-Hsiang, Lei, Tan-Fu

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Hafnium silicate nanocrystal memory using sol-gel-spin-coating method von YOU, Hsin-Chiang, HSU, Tze-Hsiang, KO, Fu-Hsiang, HUANG, Jiang-Wen, LEI, Tan-Fu

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Characteristics of [Formula Omitted] /Poly-Si Interfacial Layer on CMOS LTPS-TFTs With [Formula Omitted] Gate Dielectric and [Formula Omitted] Plasma Surface Treatment von Ma, Ming-Wen, Chiang, Tsung-Yu, Wu, Woei-Cherng, Chao, Tien-Sheng, Lei, Tan-Fu

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Vertical n-Channel Poly-Si Thin-Film Transistors With Symmetric S/D Fabricated by Ni-Silicide-Induced Lateral-Crystallization Technology von KUO, Po-Yi, CHAO, Tien-Sheng, LAI, Jiou-Teng, LEI, Tan-Fu

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Poly-Si Thin-Film Transistor Nonvolatile Memory Using Ge Nanocrystals as a Charge Trapping Layer Deposited by the Low-Pressure Chemical Vapor Deposition von KUO, Po-Yi, CHAO, Tien-Sheng, HUANG, Jyun-Siang, LEI, Tan-Fu

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Reliability Mechanisms of LTPS-TFT With [Formula Omitted] Gate Dielectric: PBTI, NBTI, and Hot-Carrier Stress von Ma, Ming-Wen, Chen, Chih-Yang, Wu, Woei-Cherng, Su, Chun-Jung, Kao, Kuo-Hsing, Chao, Tien-Sheng, Lei, Tan-Fu

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High-Performance Nanowire TFTs With Metal-Induced Lateral Crystallized Poly-Si Channels von CHANG, Chia-Wen, CHEN, Szu-Fen, CHANG, Che-Lun, DENG, Chih-Kang, HUANG, Jiun-Jia, LEI, Tan-Fu

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Characteristics of PBTI and Hot Carrier Stress for LTPS-TFT With High- \kappa Gate Dielectric von MA, Ming-Wen, CHEN, Chih-Yang, SU, Chun-Jung, WU, Woei-Chemg, WU, Yi-Hong, KAO, Kuo-Hsing, CHAO, Tien-Sheng, LEI, Tan-Fu

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Analysis of Negative Bias Temperature Instability in Body-Tied Low-Temperature Polycrystalline Silicon Thin-Film Transistors von CHEN, Chih-Yang, MA, Ming-Wen, CHEN, Wei-Cheng, LIN, Hsiao-Yi, YEH, Kuan-Lin, WANG, Shen-De, LEI, Tan-Fu

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A Simple Spacer Technique to Fabricate Poly-Si TFTs With 50-nm Nanowire Channels von CHANG, Chia-Wen, DENG, Chih-Kang, CHANG, Hong-Ren, CHANG, Che-Lun, LEI, Tan-Fu

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Influence of measuring environment on the electrical characteristics of pentacene-based thin film transistors von Wang, Yu-Wu, Cheng, Horng-Long, Wang, Yi-Kai, Hu, Tang-Hsiang, Ho, Jia-Chong, Lee, Cheng-Chung, Lei, Tan-Fu, Yeh, Ching-Fa

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