Accuracy of modified CAD/CAM generated wafer for orthognathic surgery von Park, Jin Hoo, Lee, Yong-Bin, Kim, Sang Yoon, Kim, Hyung Jun, Jung, Young-Soo, Jung, Hwi-Dong

Volltext

Modeling of Negative Capacitance in Ferroelectric Thin Films von Park, Hyeon Woo, Roh, Jangho, Lee, Yong Bin, Hwang, Cheol Seong

Volltext

Impact of operation voltage and NH3 annealing on the fatigue characteristics of ferroelectric AlScN thin films grown by sputtering von Kyung Do Kim, Yong Bin Lee, Lee, Suk Hyun, In Soo Lee, Ryoo, Seung Kyu, Seung Yong Byun, Lee, Jae Hoon, Hwang, Cheol Seong

Volltext

Voltage Drop in a Ferroelectric Single Layer Capacitor by Retarded Domain Nucleation von Kim, Yu Jin, Park, Hyeon Woo, Hyun, Seung Dam, Kim, Han Joon, Kim, Keum Do, Lee, Young Hwan, Moon, Taehwan, Lee, Yong Bin, Park, Min Hyuk, Hwang, Cheol Seong

Volltext

Double S‐Shaped Polarization – Voltage Curve and Negative Capacitance from Al2O3‐Hf0.5Zr0.5O2‐Al2O3 Triple‐Layer Structure von Park, Hyeon Woo, Oh, Minsik, Lee, In Soo, Byun, Seungyong, Jang, Yoon Ho, Lee, Yong Bin, Kim, Beom Yong, Lee, Suk Hyun, Ryoo, Seung Kyu, Shim, Doosup, Lee, Jae Hoon, Kim, Hani, Kim, Kyung Do, Hwang, Cheol Seong

Volltext

Ab initio calculation of bulk and defect properties of ductile rare-earth intermetallic compounds von Morris, James R., Ye, Yiying, Lee, Yong-Bin, Harmon, Bruce N., Gschneidner, Karl A., Russell, Alan M.

Volltext

Exploring the Physical Origin of the Negative Capacitance Effect in a Metal–Ferroelectric–Metal–Dielectric Structure von Park, Hyeon Woo, Byun, Seungyong, Kim, Kyung Do, Ryoo, Seung Kyu, Lee, In Soo, Lee, Yong Bin, Lee, Suk Hyun, Nam, Hyun Woo, Lee, Jae Hoon, Song, Jae Hee, Shin, Sung Jae, Hwang, Cheol Seong

Volltext

Dispersion in Ferroelectric Switching Performance of Polycrystalline Hf0.5Zr0.5O2 Thin Films von Hyun, Seung Dam, Park, Hyeon Woo, Kim, Yu Jin, Park, Min Hyuk, Lee, Young Hwan, Kim, Han Joon, Kwon, Young Jae, Moon, Taehwan, Kim, Keum Do, Lee, Yong Bin, Kim, Baek Su, Hwang, Cheol Seong

Volltext

A Comparative Study on the Ferroelectric Performances in Atomic Layer Deposited Hf0.5Zr0.5O2 Thin Films Using Tetrakis(ethylmethylamino) and Tetrakis(dimethylamino) Precursors von Kim, Baek Su, Hyun, Seung Dam, Moon, Taehwan, Do Kim, Keum, Lee, Young Hwan, Park, Hyeon Woo, Lee, Yong Bin, Roh, Jangho, Kim, Beom Yong, Kim, Ho Hyun, Park, Min Hyuk, Hwang, Cheol Seong

Volltext

Atomic layer deposition of HfNx films and improving the film performance by annealing under NH3 atmosphere von Ryoo, Seung Kyu, Beom Yong Kim, Yong Bin Lee, Hyeon Woo Park, Lee, Suk Hyun, Oh, Minsik, In Soo Lee, Seung Yong Byun, Shim, Doo Sup, Lee, Jae Hoon, Ha Ni Kim, Kyung Do Kim, Hwang, Cheol Seong

Volltext

Evolution of the Ferroelectric Properties of AlScN Film by Electrical Cycling with an Inhomogeneous Field Distribution von Kim, Kyung Do, Lee, Yong Bin, Lee, Suk Hyun, Lee, In Soo, Ryoo, Seung Kyu, Byun, Seungyong, Lee, Jae Hoon, Kim, Hani, Park, Hyeon Woo, Hwang, Cheol Seong

Volltext

Understanding phase evolution of ferroelectric Hf0.5Zr0.5O2 thin films with Al2O3 and Y2O3 inserted layers von Shin, Jonghoon, Seo, Haengha, Ye, Kun Hee, Yoon Ho Jang, Kwon, Dae Seon, Lim, Junil, Kim, Tae Kyun, Paik, Heewon, Song, Haewon, Ha Ni Kim, Byun, Seungyong, Shin, Seong Jae, Kyung Do Kim, Yong Bin Lee, In Soo Lee, Jung-Hae Choi, Hwang, Cheol Seong

Volltext

Numerical Simulations on Heat Transfer Enhancement of Nanofluids in Microchannel Using Vortex Generator von Yong-Bin Lee, Chuan-Chieh Liao

Volltext

Nucleation‐Limited Ferroelectric Orthorhombic Phase Formation in Hf0.5Zr0.5O2 Thin Films von Lee, Young Hwan, Hyun, Seung Dam, Kim, Hae Jin, Kim, Jun Shik, Yoo, Chanyoung, Moon, Taehwan, Kim, Keum Do, Park, Hyeon Woo, Lee, Yong Bin, Kim, Baek Su, Roh, Jangho, Park, Min Hyuk, Hwang, Cheol Seong

Volltext

Field‐Induced Ferroelectric Hf1‐xZrxO2 Thin Films for High‐k Dynamic Random Access Memory von Hyun, Seung Dam, Park, Hyeon Woo, Park, Min Hyuk, Lee, Young Hwan, Lee, Yong Bin, Kim, Beom Yong, Kim, Ho Hyun, Kim, Baek Su, Hwang, Cheol Seong

Volltext

Transient Negative Capacitance Effect in Atomic‐Layer‐Deposited Al2O3/Hf0.3Zr0.7O2 Bilayer Thin Film von Kim, Keum Do, Kim, Yu Jin, Park, Min Hyuk, Park, Hyeon Woo, Kwon, Young Jae, Lee, Yong Bin, Kim, Han Joon, Moon, Taehwan, Lee, Young Hwan, Hyun, Seung Dam, Kim, Baek Su, Hwang, Cheol Seong

Volltext

Anisotropy of the pairing gap of FeAs-based superconductors induced by spin fluctuations von Sknepnek, Rastko, Samolyuk, German, Lee, Yong-bin, Schmalian, Jörg

Volltext

Diode Property and Positive Temperature Coefficient of Resistance of Pt/Al2O3/Nb:SrTiO3 von Moon, Taehwan, Lee, Hyun Jae, Kim, Keum Do, Lee, Young Hwan, Hyun, Seung Dam, Park, Hyeon Woo, Lee, Yong Bin, Kim, Baek Su, Hwang, Cheol Seong

Volltext

Comparison study on the accuracy of metamodeling technique for non-convex functions von Kim, Byeong-Soo, Lee, Yong-Bin, Choi, Dong-Hoon

Volltext

Low-grade osteosarcoma arising from cemento-ossifying fibroma: a case report von Lee, Yong Bin, Kim, Nam-Kyoo, Kim, Jae-Young, Kim, Hyung Jun

Volltext