Microsphere-assisted, nanospot, non-destructive metrology for semiconductor devices von Kwon, Soonyang, Park, Jangryul, Kim, Kwangrak, Cho, Yunje, Lee, Myungjun

Volltext

Lens-free reflective topography for high-resolution wafer inspection von Lee, Hojun, Sung, Jangwoon, Park, Seungbeom, Shin, Junho, Kim, Hyungjin, Kim, Wookrae, Lee, Myungjun

Volltext

Field-portable reflection and transmission microscopy based on lensless holography von Lee, Myungjun, Yaglidere, Oguzhan, Ozcan, Aydogan

Volltext

Microsphere-assisted hyperspectral imaging: super-resolution, non-destructive metrology for semiconductor devices von Park, Jangryul, Choi, Youngsun, Kwon, Soonyang, Lee, Youngjun, Kim, Jiwoong, Kim, Jae-joon, Lee, Jihye, Ahn, Jeongho, Kwak, Hidong, Yang, Yusin, Jo, Taeyong, Lee, Myungjun, Kim, Kwangrak

Volltext

Snapshot Mueller spectropolarimeter imager von Dai, Tianxiang, Phan, Thaibao, Wang, Evan W., Kwon, Soonyang, Son, Jaehyeon, Lee, Myungjun, Fan, Jonathan A.

Volltext

Automatic beam optimization method for scanning electron microscopy based on electron beam Kernel estimation von Cho, Yunje, Cho, Junghee, Park, Jonghyeok, Wang, Jeonghyun, Jeong, Seunggyo, Lee, Jubok, Hwang, Yun, Kim, Jiwoong, Yu, Jeongwoo, Chung, Heesu, Park, Hyenok, Shon, Subong, Jo, Taeyong, Lee, Myungjun, Kim, Kwangrak

Volltext

Edge roughness analysis in nanoscale for single-molecule localization microscopy images von Jeong, Uidon, Go, Ga-eun, Jeong, Dokyung, Lee, Dongmin, Kim, Min Jeong, Kang, Minjae, Kim, Namyoon, Jung, Jaehwang, Kim, Wookrae, Lee, Myungjun, Kim, Doory

Volltext

Information theoretic framework for the analysis of a slow-light delay device von Neifeld, Mark A., Lee, Myungjun

Volltext

Information-theoretic analysis of a stimulated-Brillouin-scattering-based slow-light system von Lee, Myungjun, Zhu, Yunhui, Gauthier, Daniel J, Gehm, Michael E, Neifeld, Mark A

Volltext

Scanning Magneto-optic Kerr effect microscope for inspection of MRAM manufacturing von Numata, Mitsunori, Kim, Ingi, Suzuki, Kenji, Ueyama, Shinji, Kim, Jinseob, Kim, Wookrae, Lee, Myungjun

Volltext

Fourier ptychographic topography von Wang, Hao, Zhu, Jiabei, Sung, Jangwoon, Hu, Guorong, Greene, Joseph, Li, Yunzhe, Park, Seungbeom, Kim, Wookrae, Lee, Myungjun, Yang, Yusin, Tian, Lei

Volltext

Development of Highly Dense Material-Specific Fluorophore Labeling Method on Silicon-Based Semiconductor Materials for Three-Dimensional Multicolor Super-Resolution Fluorescence Im... von Jeong, Uidon, Jeong, Dokyung, Go, Seokran, Park, Hyunbum, Kim, Geun-ho, Kim, Namyoon, Jung, Jaehwang, Kim, Wookrae, Lee, Myungjun, Choi, Changhoon, Kim, Doory

Volltext

Multi spectral holographic ellipsometry for a complex 3D nanostructure von Jung, Jaehwang, Kim, Wookrae, Kim, Jinseob, Lee, Seungwoo, Shin, Inho, Yoon, Changhyeong, Jeong, Seoyeon, Hidaka, Yasuhiro, Numata, Mitsunori, Ueyama, Shinji, Choi, Changhoon, Lee, Myungjun

Volltext

Capacity of electromagnetic communication modes in a noise-limited optical system von Lee, Myungjun, Neifeld, Mark A, Ashok, Amit

Volltext

P‐165: High Resolution Black Color Patterns Fabricated by Photo‐Lithography with a Novel High Adhesion Polymer for Pixel Defining Layer of OLED von Lee, Myungjun, Bae, Jun, Ahn, Seonhong, Lee, Bumsung

Volltext

Modern Trends in Imaging VIII: Lensfree Computational Microscopy Tools for Cell and Tissue Imaging at the Point-of-Care and in Low-Resource Settings von Isikman, Serhan O., Greenbaum, Alon, Lee, Myungjun, Bishara, Waheb, Mudanyali, Onur, Su, Ting-Wei, Ozcan, Aydogan

Volltext

Improved slow-light delay performance of a broadband stimulated Brillouin scattering system using fiber Bragg gratings von Lee, Myungjun, Pant, Ravi, Neifeld, Mark A

Volltext

High-fidelity, broadband stimulated-Brillouin-scattering-based slow light using fast noise modulation von Zhu, Yunhui, Lee, Myungjun, Neifeld, Mark A, Gauthier, Daniel J

Volltext

Information theoretic framework for the analysis of a slow-light delay device : Slow light and its applications von NEIFELD, Mark A, LEE, Myungjun

Volltext

Fourier spectrum method to determine dose-to-clear in a photoresist von Sun, Lei, Wood, Obert, Clifford, Chris, Raghunathan, Sudhar, Kritsun, Oleg, Lee, Myungjun, Kim, Ryoung-Han, Mangat, Pawitter, Koh, Hui Peng, Levinson, Harry

Volltext