A Monte Carlo model for trapped charge distribution in electron-irradiated α-quartz von OH, K. H, ONG, C. K, TAN, B. T. G, LE GRESSUS, G

Volltext

Electron-trapping and energy localization in insulating materials. Technological impact of space charge electron-beam characterization von Blaise, G., Le Gressus, C.

Volltext

Charging and flashover induced by surface polarization relaxation process von BLAISE, G, LE GRESSUS, C

Volltext

Flashover in wide-band-gap high-purity insulators : methodology and mechanisms von LE GRESSUS, C, VALIN, F, HENRIOT, M, GAUTIER, M, DURAND, J. P, SUDARSHAN, T. S, BOMMAKANTI, R. G, BLAISE, G

Volltext

Effect of Nonstoichiometry on Fracture Toughness and Hardness of Yttrium Oxide Ceramics von Fantozzi, Gilbert, Orange, Gilles, Liang, Kaiming, Gautier, Martine, Duraud, Jean-Paul, Maire, Philippe, Le Gressus, Claude, Gillet, E.

Volltext

Variation of the relative permittivity of charged dielectrics von Ong, C. K., Song, Z. G., Oh, K. H., Gong, H., Le Gressus, C.

Volltext

Charge trapping on different cuts of a single-crystalline α-SiO2 von GONG, H, LE GRESSUS, C, OH, K. H, DING, X. Z, ONG, C. K, TAN, B. T. G

Volltext

Correlation of insulator properties with electron spectroscopic observations von Le Gressus, C., Blaise, G.

Volltext

Correlation of insulator properties with electron spectroscopic observations: Analysis of thin films, interfaces and surfaces von LE GRESSUS, C, BLAISE, G

Volltext

Variation of trapping/detrapping properties as a function of the insulator size von OH, K. H, ONG, C. K, TAN, B. T. G, LE GRESSUS, C, BLAISE, G

Volltext

Insulator surface analysis von Le Gressus, C., Blaise, G.

Volltext

Insulator surface analysis von Le Gressus, C., Blaise, G.

Volltext

Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope technique von OH, K. H, LE GRESSUS, C, GONG, H, TAN, B. T. G, DING, X. Z

Volltext

Insulator surface analysis: Changing effects in electron spectroscopy von LE GRESSUS, C, BLAISE, G

Volltext

Breakdown phenomena related to trapping/detrapping processes in wide band gap insulators von Le Gressus, C., Blaise, G.

Volltext

Grafting and growing mechanisms of polymerised organic films onto metallic surfaces von Lecayon, G., Bouizem, Y., Le Gressus, C., Reynaud, C., Boiziau, C., Juret, C.

Volltext

Charge trapping on different cuts of a single-crystalline alpha -SiO sub 2 von Gong, H, Le Gressus, C, Oh, K-H, Ding, X-Z, Ong, C-K, Tan, B T G

Volltext

Dielectric polarization relaxation measurement in alpha -SiO sub 2 by means of a scanning electron microscope technique von Oh, K H, Le Gressus, C, Gong, H, Ong, C K, Tan, B T G, Ding, X Z

Volltext

Spectroscopic studies of a metallic surface modification by grafting and growth of a polymeric film von Viel, P., Deniau, G., Lecayon, G., Le Gressus, C.

Volltext

Effect of the insulator size on the breakdown strength von Damamme, G., Le Gressus, C.

Volltext bestellen