Synthesis of Si1-yCy alloys by molecular beam epitaxy von IYER, S. S, EBERT, K, GOORSKY, M. S, LE GOUES, F. K, TSANG, J. C, CARDONE, F

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Polytype formation in zirconium-silicon thin films von Bourret, A., d’Heurle, F. M., Le Goues, F. K., Charai, A.

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Characterization of Si/SiGe strained-layer superlattices grown by ultrahigh vacuum/chemical vapor deposition technique von WANG, P. J, GOORSKY, M. S, MEYERSON, B. S, LE GOUES, F. K, TEJWANI, M. J

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Stacking faults in WSi2: resistivity effects von D'HEURLE, F. M, LE GOUES, F. K, JOSHI, R, SUNI, I

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A Discrete Lattice Plane Analysis of the Energy of Coherent {0001} sub h.c.p. //{111} sub f.c.c. , < 1120 > sub h.c.p. // < 110 > sub f.c.c. Interfaces von Ramanujan, R V, Lee, J K, Le Goues, F K, Aaronson, H I

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A discrete lattice plane analysis of the energy of coherent {0001}h.c.p.//{111}f.c.c., h.c.p.// f.c.c. interfaces von RAMANUJAN, R. V, LEE, J. K, LE GOUES, F. K, AARONSON, H. I

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Influence of thin SiO2 interlayers on chemical reaction and microstructure at the Ni/Si(111) interface von LIEHR, M, LEFAKIS, H, LE GOUES, F. K, RUBLOFF, G. W

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Improved Crossover Operators for Genetic Programming for Program Repair von Oliveira, Vinicius Paulo L., Souza, Eduardo F. D., Le Goues, Claire, Camilo-Junior, Celso G.

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Ion-implantation-induced fluorine agglomeration in tungsten disilicide prepared by low-pressure chemical vapour deposition von Petersson, C.Sture, Whitlow, Harry J., Keinonen, Juhani, D'heurle, François M., Le Goues, Françoise K., Joshi, Rajiv V., Scilla, Gerald, Thomas, Olivier

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