Influence of charge trapping on failure detection and its distributions for nFET high-κ stacks von Wu, E. Y., Ioannou, D. P., LaRow, C. B.

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Dual Stage Voltage Ramp Stress Test for Gate Dielectrics von BROCHU, JR. DAVID G, RAHIM NILUFA, LAROW CHARLES B, MERRILL TRAVIS S, DUFRESNE ROGER A, WU ERNEST Y

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