XPS survey spectra simulation of nano-structured surfaces von Ollivier, E., Langeron, J. P.

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Use of the direct energy spectra in Auger electron spectroscopy von Langeron, J.-P.

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Diffusion of silicon in titanium nitride films. Efficiency of TiN barrier layers von Grigorov, K. G., Grigorov, G. I., Stoyanova, M., Vignes, J. L., Langeron, J. P., Denjean, P., Perriere, J.

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Aluminium diffusion in titanium nitride films. Efficiency of TiN barrier layers von Grigorov, G. I., Grigorov, K. G., Stoyanova, M., Vignes, J. L., Langeron, J. P., Denjean, P.

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Quantitative AES depth profiling of thin oxide films grown on stainless steels and aluminium von Lorang, G., Xu, J. L., Langeron, J.-P.

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AES depth profiling of passive overlayers formed on nickel alloys von Lorang, G., Jallerat, N., Quang, K. Vu, Langeron, J.-P.

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A simple estimate of deposited energy and concentration profiles in films produced by Ion-Assisted Physical Vapour Deposition von Grigorov, K. G., Bouchier, D., Grigorov, G. I., Vignes, J-L, Langeron, J-P

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Iron diffusion from pure Fe substrate into TiN buffer layers von Grigorov, G.I., Grigorov, K.G., Stojanova, M., Vignes, J.L., Langeron, J.P., Denjean, P., Ranno, L.

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Formation of zirconia—ceria layers on silicon wafers using laser ablation von Akimov, A.G., Bogomolov, D.B., Gorodetskii, A.E., Kazanskii, L.P., Khodan, A.N., Krylov, I.L., Langeron, J.-P., Melnikova, N.A., Michel, D., Vignes, J.-L., Perrière, J.

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A choice of the optimum density of ion bombardment by ion-assisted physical vapour deposition of films von Grigorov, G.I., Martev, I.N., Langeron, J.-P., Vignes, J.-L.

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Low temperature growth of highly oriented TiN films by ion-assisted deposition von Grigorov, G.I., Martev, I.N., Stoyanova, M.V., Vignes, J.-L., Langeron, J.-P.

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Simulation of the LMM auger spectra of copper von Dubot, P., Jousset, D., Pinet, V., Pellerin, F., Langeron, J. P.

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Interdiffusion of Y-Ba-Cu oxides and SiO2 substrate. Efficiency of titanium nitride barrier film von GRIGOROV, K. G, GRIGOROV, G. I, STOYANOVA, M. V, CHAKALOV, R. A, VIGNES, J.-L, LANGERON, J.-P, DENJEAN, P

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Quantitative Auger analysis of passive films formed on stainless steels von Lorang, G., Basile, F., Da Cunha Belo, M., Langeron, J.-P.

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Superstoichiometric h-BN films synthesized by ion-beam assisted deposition; N-concentration and respective ion energy dissipation von Grigorov, K.G, Grigorov, G.I, Vignes, J.L, Langeron, J.-P

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Silicon nitride films produced by ion-beam assisted deposition: bulk and near-surface composition von Grigorov, G.I, Grigorov, K.G, Bouchier, D, Vignes, J.-L, Langeron, J.-P

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Quantitative Auger electron spectroscopic analysis of titanium nitrides von Vignes, J.L., Langeron, J.P., Grigorov, G.I., Martev, I.N., Stoyanova, M.V.

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Study by Auger Spectrometry and Cathodic Reduction of Passive Films Formed on Ferritic Stainless Steels von da Cunha Belo, M., Rondot, B., Pons, F., Le Héricy, J., Langeron, J. P.

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Surface composition analysis of Au-Cu alloy by micro-auger electron spectroscopy von Asahara, Y., Tokutaka, H., Nishimori, K., Ishihara, N., Makino, N., Héricy, J.Le, Langeron, J.P.

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A comparative Rutherford backscattering spectrometry and Auger electron spectroscopy depth profile study of Fe-N films von De Rugy, H., Langeron, J.P., Bouquet, S., Minel, L., Grigonov, G.I., Martev, I.N.

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