Interdigitated coplanar electrodes for enhanced sensitivity in a photorefractive polymer von CHRISTENSON, C. W, GREENLEE, C, PEYGHAMBARIAN, N, LYNN, B, THOMAS, J, BLANCHE, P.-A, VOORAKARANAM, R, HILAIRE, P. St, LACOMB, L. J, NORWOOD, R. A, YAMAMOTO, M

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Contrast mechanism for resolving organic molecules with tunnelling microscopy von Spong, J. K, Mizes, H. A, LaComb Jr, L. J, Dovek, M. M, Frommer, J. E, Foster, J. S

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Waveguide image combiners for augmented reality displays von Bablumyan, Arkady, LaComb, Jr., Lloyd J

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Recent advancements in photorefractive holographic imaging von Lynn, B, Blanche, P-A, Bablumian, A, Rankin, R, Voorakaranam, R, Hilaire, P St, LaComb, L, Yamamoto, M, Peyghambarian, N

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LASER GENERATION APPARATUS AND SOURCES USING THE SAME von Kaneda, Yushi, Kieu, Khanh, LaComb, JR., Lloyd J

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Volume holographic optical elements for imaging with reduced aberrations von Peyghambarian, Nasser N, Bablumyan, Arkady, LaComb, Jr., Lloyd J

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WAVEGUIDE IMAGE COMBINERS FOR AUGMENTED REALITY DISPLAYS von Bablumyan, Arkady, LaComb, JR., Lloyd J

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Volume Holographic Optical Elements for Imaging with Reduced Aberrations von Peyghambarian Nasser N, Bablumyan Arkady, LaComb, JR. Lloyd J

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Polarization-enhanced imaging of photoresist gratings in the real-time scanning optical microscope von Corle, T R, Mantalas, L C, Kaack, T R, Lacomb, Jr, L J

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Method and apparatus for in-situ monitoring of thickness using a multi-wavelength spectrometer during chemical-mechanical polishing von LACOMB, JR. LLOYD J, FIELDEN, JOHN, JAIRATH, RAHUL, CHADDA, SAKET, PECEN, JIRI

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VERFAHREN UND VORRICHTUNG ZUM ÜBERWACHEN DER DICKE MIT EINEM MEHRWELLENLÄNGEN-SPEKTROMETER IN EINEM CHEMISCH-MECHANISCHEN POLIERVERFAHREN von LACOMB, JR, LLOYD J, FIELDEN, JOHN, JAIRATH, RAHUL, CHADDA, SAKET, KRUSSEL, WILBUR C, PECEN, JIRI

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Method and apparatus for in-situ monitoring of thickness using a multi-wavelength spectrometer during chemical-mechanical polishing von LACOMB, JR, LLOYD J, FIELDEN, JOHN, JAIRATH, RAHUL, CHADDA, SAKET, KRUSSEL, WILBUR C, PECEN, JIRI

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Focused beam spectroscopic ellipsometry method and system von Piwonka-Corle, Timothy R, Scoffone, Karen F, Chen, Xing, Lacomb, Jr., Lloyd J, Stehle, Jean-Louis, Zahorski, Dorian, Rey, John-Pierre

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Millimeter-Wave Acoustic Transducers von Quate, C F, LaComb, Jr , L J, Wright, D R

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Method and apparatus for in-situ monitoring of thickness using a multi-wavelength spectrometer during chemical-mechanical polishing von FIELDEN, JOHN, PECEN, JIRI, CHADDA, SAKET, LACOMB, JR., LLOYD J, JAIRATH, RAHUL, KRUSELL, WILBUR C

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Method and apparatus for in-situ monitoring of thickness using a multi-wavelength spectrometer during chemical-mechanical polishing von LACOMB, JR, LLOYD J, FIELDEN, JOHN, JAIRATH, RAHUL, CHADDA, SAKET, KRUSSEL, WILBUR C, PECEN, JIRI

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Focused beam spectroscopic ellipsometry method and system von STEHLE, JEAN-LOUIS, LACOMB, JR., LLOYD J, ZAHORSKI, DORIAN, PIWONKA-CORLE, TIMOTHY R, CHEN, XING

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METHOD AND DEVICE MONITORING THICKNESS ON THE SPOT USING MULTIPLEX WAVE LENGTH SPECTROMETER DURING CHEMICAL AND MECHANICAL POLISHING von PECEN JIRI, FIELDEN JOHN, LACOMB JR LLOYD J, CHADDA SAKET, JAIRATH RAHUL, KRUSSEL WILBUR C

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Method and apparatus for in-situ monitoring of thickness using a multi-wavelength spectrometer during chemical-mechanical polishing von LACOMB, JR, LLOYD J, FIELDEN, JOHN, JAIRATH, RAHUL, CHADDA, SAKET, KRUSSEL, WILBUR C, PECEN, JIRI

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