Determination of the energetic resolution of Schottky barrier visualization via interface band structure and parallel momentum conservation von Rogers, Jack, Nolting, Westly, Durcan, Chris, Balsano, Robert, LaBella, Vincent P.

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Schottky barrier height measurements of Cu/Si(001), Ag/Si(001), and Au/Si(001) interfaces utilizing ballistic electron emission microscopy and ballistic hole emission microscopy von Balsano, Robert, Matsubayashi, Akitomo, LaBella, Vincent P.

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Fabrication of 5-20 nm thick β -W films von Narasimham, Avyaya J., Medikonda, Manasa, Matsubayashi, Akitomo, Khare, Prasanna, Chong, Hyuncher, Matyi, Richard J., Diebold, Alain, LaBella, Vincent P.

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Arsenic-rich GaAs(0 0 1) surface structure von LaBella, Vincent P., Krause, Michael R., Ding, Zhao, Thibado, Paul M.

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Detection of silicide formation in nanoscale visualization of interface electrostatics von Nolting, Westly, Durcan, Chris, LaBella, Vincent P.

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Microstructure fabrication process induced modulations in CVD graphene von Matsubayashi, Akitomo, Zhang, Zhenjun, Lee, Ji Ung, LaBella, Vincent P.

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Fermi Level Manipulation through Native Doping in the Topological Insulator Bi2Se3 von Walsh, Lee A, Green, Avery J, Addou, Rafik, Nolting, Westly, Cormier, Christopher R, Barton, Adam T, Mowll, Tyler R, Yue, Ruoyu, Lu, Ning, Kim, Jiyoung, Kim, Moon J, LaBella, Vincent P, Ventrice, Carl A, McDonnell, Stephen, Vandenberghe, William G, Wallace, Robert M, Diebold, Alain, Hinkle, Christopher L

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Nanoscale Schottky barrier visualization utilizing computational modeling and ballistic electron emission microscopy von Nolting, Westly, Durcan, Chris, Gassner, Steven, Goldberg, Joshua, Balsano, Robert, LaBella, Vincent P.

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Visualizing metal/HfO2/SiO2/Si(001) interface electrostatic barrier heights with ballistic hole emission microscopy von Rogers, Jack, Choi, Hyeonseon, Gassner, Steven, Nolting, Westly, Pennock, Daniel, Consiglio, Steven, LaBella, Vincent P.

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Time dependent changes in Schottky barrier mapping of the W/Si(001) interface utilizing ballistic electron emission microscopy von Durcan, Chris A., Balsano, Robert, LaBella, Vincent P.

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Pulsed-N2 assisted growth of 5-20 nm thick β -W films von Narasimham, Avyaya J., Green, Avery, Matyi, Richard J., Khare, Prasanna, Vo, Tuan, Diebold, Alain, LaBella, Vincent P.

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Relating spatially resolved maps of the Schottky barrier height to metal/semiconductor interface composition von Balsano, Robert, Durcan, Chris, Matsubayashi, Akitomo, Narasimham, Avyaya J., LaBella, Vincent P.

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Nanoscale mapping of the W/Si(001) Schottky barrier von Durcan, Chris A., Balsano, Robert, LaBella, Vincent P.

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Fermi Level Manipulation through Native Doping in the Topological Insulator Bi 2 Se 3 von Walsh, Lee A, Green, Avery J, Addou, Rafik, Nolting, Westly, Cormier, Christopher R, Barton, Adam T, Mowll, Tyler R, Yue, Ruoyu, Lu, Ning, Kim, Jiyoung, Kim, Moon J, LaBella, Vincent P, Ventrice, Jr, Carl A, McDonnell, Stephen, Vandenberghe, William G, Wallace, Robert M, Diebold, Alain, Hinkle, Christopher L

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Temperature dependent spin precession measurements in trilayer graphene utilizing co/graphene contacts von Abel, Joseph, Matsubayashi, Akitomo, Garramone, John J., LaBella, Vincent P.

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Nanoscale Schottky barrier mapping of thermally evaporated and sputter deposited W/Si(001) diodes using ballistic electron emission microscopy von Nolting, Westly, Durcan, Chris, Narasimham, Avyaya J., LaBella, Vincent P.

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Economical rotatable holder for magnetotransport measurements von Narasimham, Avyaya J., Pennock, Daniel, Potter, Graham J., Taylor, Brian, LaBella, Vincent P.

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Low cost cryogenic high vacuum sample holder for in-plane magneto-transport studies von Abel, Joseph, Matsubayashi, Akitomo, LaBella, Vincent P.

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Signatures of the semiconductor crystallographic orientation on the charge transport across non-epitaxial diodes von Garramone, John J., Abel, Joseph R., Barraza-Lopez, Salvador, LaBella, Vincent P.

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Schottky barrier height measurements of Cu/Si(001), Ag/Si(001), and Au/Si(001) interfaces utilizing ballistic electron emission microscopy and ballistic hole emission microscopy von Balsano, Robert, Matsubayashi, Akitomo, LaBella, Vincent P.

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