Determining the sub-surface damage of CdTe single crystals after lapping von Šik, O., Škvarenina, L., Caha, O., Moravec, P., Škarvada, P., Belas, E., Grmela, L.

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Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties von Šik, O., Bábor, P., Škarvada, P., Potoček, M., Trčka, T., Grmela, L., Belas, E.

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Quantitative fluctuation-enhanced sensing in amperometric NO2 sensors von Kuberský, P., Sedlák, P., Hamáček, A., Nešpůrek, S., Kuparowitz, T., Šikula, J., Majzner, J., Sedlaková, V., Grmela, L., Syrový, T.

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Contact quality analysis and noise sources determination of CdZnTe-based high-energy photon detectors von Sik, O, Skarvada, P, Grmela, L, Elhadidy, H, Vondra, M, Sikula, J, Franc, J

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Study of electric field distribution and low frequency noise of CdZnTe radiation detectors von Sik, O, Grmela, L, Elhadidy, H, Dedic, V, Sikula, J, Grmela, P, Franc, J, Skarvada, P, Holcman, V

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Investigation of excess 1/f noise in CdTe single crystals von Andreev, A, Grmela, L, Moravec, P, Bosman, G, Sikula, J

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Detection and Localization of Defects in Monocrystalline Silicon Solar Cell von Tománek, P., Škarvada, P., Macků, R., Grmela, L.

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Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices von GRMELA, L, MACKU, R, TOMANEK, P

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Experimental Analysis of Noise in CdTe Radiation Detectors von Andreev, A, Grmela, L, Raska, M, Sikula, J, Moravec, P

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Cold field emission electrode as a local probe of proximal microscopes: Investigation of defects in monocrystalline silicon solar cells von Tománek, P., Škarvada, P., Dallaeva, D., Grmela, L., Macků, R., Smith, S.

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Noise Sources in the CdTe radiation detectors von Grmela, L, Zajacek, J, Andreev, A, Sikula, J, Moravec, P

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Cold Field-Emission Cathode Noise Analysis von Knápek, Alexandr, Grmela, Lubomír, Sikula, Josef, Sik, Ondrej

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Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency von Škarvada, Pavel, Grmela, Lubomír, Tománek, Pavel

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Low Frequency Noise of Tantalum Capacitors von Sikula, J., Hlavka, J., Pavelka, J., Sedlakova, V., Grmela, L., Tacano, M., Hashiguchi, S.

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Local investigation of monocrystalline silicon solar cells defects von Tomanek, P., Skarvada, P., Grmela, L., Macku, R., Smith, S. J.

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Near-Field Study of Carrier Dynamics in InAs/GaAs Quantum Dots Grown on InGaAs Layers von Grmela, Lubomír, Benešová, Markéta, Dobis, Pavel, Tománek, Pavel

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Microstructure and rheology of polymer melts reinforced by long glass fibres: direct simulations von Thomasset, J, Grmela, M, Carreau, P.J

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Noise diagnostic method of experimental cold field-emission cathodes von Sergeev, E., Knapek, A., Grmela, L., Sikula, J.

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Hybrid STM/R-SNOM with novel probe von Tománek, Pavel, Brüstlová, Jitka, Dobis, Pavel, Grmela, Lubomir

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Contacts charge transport and additional noise properties of semiconductor CdTe sensors von Sik, O., Grmela, L., Sikula, J.

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