A Systematic Compact Model Parameter Calibration with Adaptive Pattern Search Algorithm von Chang, Jeesoo, Hwang, Sungmin, Park, Kyungchul, Jang, Taejin, Min, Kyung-Kyu, Oh, Min-Hye, Park, Jonghyuk, Lee, Jong-Ho, Park, Byung-Gook

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Effect of Al Concentration on Ferroelectric Properties in HfAlOx‐Based Ferroelectric Tunnel Junction Devices for Neuroinspired Applications von Kim, Jihyung, Kim, Dahye, Min, Kyung Kyu, Kraatz, Matthias, Han, Taeyoung, Kim, Sungjun

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Low-Latency Spiking Neural Networks Using Pre-Charged Membrane Potential and Delayed Evaluation von Hwang, Sungmin, Chang, Jeesoo, Oh, Min-Hye, Min, Kyung Kyu, Jang, Taejin, Park, Kyungchul, Yu, Junsu, Lee, Jong-Ho, Park, Byung-Gook

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Highly Sensitive Ultraviolet Photodetector Based on an AlGaN/GaN HEMT with Graphene‐On‐p‐GaN Mesa Structure von Pandit, Bhishma, Jang, Hyeon‐Sik, Jeong, Yunjo, An, Sangmin, Chandramohan, S., Min, Kyung Kyu, Won, Sang Min, Choi, Chel‐Jong, Cho, Jaehee, Hong, Seongin, Heo, Keun

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Zinc Tin Oxide Synaptic Device for Neuromorphic Engineering von Ryu, Ji-Ho, Kim, Boram, Hussain, Fayyaz, Ismail, Muhammad, Mahata, Chandreswar, Oh, Teresa, Imran, Muhammad, Min, Kyung Kyu, Kim, Tae-Hyeon, Yang, Byung-Do, Cho, Seongjae, Park, Byung-Gook, Kim, Yoon, Kim, Sungjun

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1/f Noise in Synaptic Ferroelectric Tunnel Junction: Impact on Convolutional Neural Network von Shin, Wonjun, Min, Kyung Kyu, Bae, Jong-Ho, Kim, Jaehyeon, Koo, Ryun-Han, Kwon, Dongseok, Kim, Jae-Joon, Kwon, Daewoong, Lee, Jong-Ho

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Interpolation method for ToF depth sensor with pseudo 4-tap pixel architecture von Kim, Tae-Chan, Bae, Kwanghyuk, Kyung, Kyu-Min, Han Cho, Shung

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3D AND-Type Stacked Array for Neuromorphic Systems von Jang, Taejin, Kim, Suhyeon, Chang, Jeesoo, Min, Kyung Kyu, Hwang, Sungmin, Park, Kyungchul, Lee, Jong-Ho, Park, Byung-Gook

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New biometrics-acquisition method using time-of-flight depth camera von Tae-Chan Kim, Kyu-Min Kyung, Kwanghyuk Bae

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Robust TSK Fuzzy Modeling Approach Using Noise Clustering Concept for Function Approximation von Kim, Kyoungjung, Kyung, Kyu Min, Park, Chang-Woo, Kim, Euntai, Park, Mignon

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Interlayer engineering for enhanced ferroelectric tunnel junction operations in HfO x -based metal-ferroelectric-insulator-semiconductor stack von Min, Kyung Kyu, Yu, Junsu, Kim, Yeonwoo, Lee, Jong-Ho, Kwon, Daewoong, Park, Byung-Gook

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Reset-voltage-dependent precise tuning operation of TiOx/Al2O3 memristive crossbar array von Kim, Tae-Hyeon, Nili, Hussein, Kim, Min-Hwi, Min, Kyung Kyu, Park, Byung-Gook, Kim, Hyungjin

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Lamination method for improved polarization-leakage current relation in HfO2-based metal/ferroelectric/insulator/semiconductor structure von Kim, Yeonwoo, Min, Kyung Kyu, Yu, Junsu, Kwon, Daewoong, Park, Byung-Gook

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Trap-Induced Data-Retention-Time Degradation of DRAM and Improvement Using Dual Work-Function Metal Gate von Kim, Kyoung Yeon, Min, Kyung Kyu, Park, Byung-Gook

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Comprehensive and accurate analysis of the working principle in ferroelectric tunnel junctions using low-frequency noise spectroscopy von Shin, Wonjun, Min, Kyung Kyu, Bae, Jong-Ho, Yim, Jiyong, Kwon, Dongseok, Kim, Yeonwoo, Yu, Junsu, Hwang, Joon, Park, Byung-Gook, Kwon, Daewoong, Lee, Jong-Ho

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Capacitor-Based Synaptic Devices for Hardware Spiking Neural Networks von Hwang, Sungmin, Yu, Junsu, Lee, Geun Ho, Song, Min Suk, Chang, Jeesoo, Min, Kyung Kyu, Jang, Taejin, Lee, Jong-Ho, Park, Byung-Gook, Kim, Hyungjin

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Unveiling Resistance Switching Mechanisms in Undoped HfOx Ferroelectric Tunnel Junction Using Low-Frequency Noise Spectroscopy von Shin, Wonjun, Koo, Ryun-Han, Min, Kyung Kyu, Kwon, Dongseok, Kim, Jae-Joon, Kwon, Daewoong, Lee, Jong-Ho

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Unveiling Resistance Switching Mechanisms in Undoped HfO x Ferroelectric Tunnel Junction Using Low-Frequency Noise Spectroscopy von Shin, Wonjun, Koo, Ryun-Han, Min, Kyung Kyu, Kwon, Dongseok, Kim, Jae-Joon, Kwon, Daewoong, Lee, Jong-Ho

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Lamination method for improved polarization-leakage current relation in HfO 2 -based metal/ferroelectric/insulator/semiconductor structure von Kim, Yeonwoo, Min, Kyung Kyu, Yu, Junsu, Kwon, Daewoong, Park, Byung-Gook

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Effect of Carrier Transport Process on Tunneling Electroresistance in Ferroelectric Tunnel Junction von Koo, Ryun-Han, Shin, Wonjun, Min, Kyung Kyu, Kwon, Dongseok, Kim, Dae Hwan, Kim, Jae-Joon, Kwon, Daewoong, Lee, Jong-Ho

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