X-ray production range in solids by 2-15 keV electrons von Reuter, W, Kuptsis, J D, Lurio, A, Kyser, D F

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Effects of substrate bias and annealing on the properties of amorphous alloy films of Gd-Co, Gd-Fe, and Gd-Co- X ( X =Mo,Cu,Au) von Heiman, Neil, Kazama, N., Kyser, D. F., Minkiewicz, V. J.

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Electron-beam resist edge profile simulation von Neureuther, A.R., Kyser, D.F., Ting, C.H.

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Resolution and linewidth tolerances in electron beam and optical projection lithography von Tung Symon Chang, Kyser, D.F., Ting, C.H.

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Thin film x-ray spectrometry von Geiss, Roy H., Kyser, David F.

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Thermal Decomposition of Gallium Arsenide von Millea, M. F., Kyser, D. F.

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Etching of Gallium Arsenide with Nitric Acid von Kyser, D. F., Millea, M. F.

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Capacitance-voltage dependence of zinc-diffused GaAs p-n junctions von Aukerman, L.W., Kyser, D.F., Millea, M.F.

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Monte Carlo simulation of fast secondary electron production in electron beam resists von Murata, Kenji, Kyser, David F., Ting, Chiu H.

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Annealing Study of EuO Films Doped with Iron and Europium von Suits, J. C., Lee, Kenneth, Winters, H. F., Phipps, P. B. P., Kyser, D. F.

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Energy deposition functions in electron resist films on substrates von Parikh, Mihir, Kyser, David F.

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Effects of substrate bias and annealing on the properties of amorphous alloy films of Gd-Co, Gd-Fe, and Gd-Co-X /X=Mo, Cu, Au/ (for magnetic bubble and magneto-optic applications) von Heiman, N, Kyser, D F, MINKIEWICZ, V J, Kazama, N

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Effects of Substrate Bias and Annealing on the Properties of Amorphous Alloy Films of GdCo, Gd-Fe and Gd-Co-X (X equals Mo, Cu, Au) von Heiman, N, Kazama, N, Kyser, D F, Minkiewicz, V J

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Measurement of Diffusion Lengths in Direct-Gap Semiconductors by Electron-Beam Excitation von Wittry, David B., Kyser, David F.

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Prediction of X-Ray Production and Electron Scattering in Electron-Probe Analysis Using a Transport Equation von Brown, D. B., Wittry, D. B., Kyser, D. F.

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THE THERMAL DECOMPOSITION OF GALLIUM ARSENIDE von Millea,M. F, Kyser,D. F

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Cathodoluminescence at p - n Junctions in GaAs von Wittry, David B., Kyser, David F.

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CAPACITANCE-VOLTAGE DEPENDENCE OF ZINCDIFFUSED GAAS P-N JUNCTIONS von Aukerman,L W, Kyser,D F, Millea,M F

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Spatial distribution of excess carriers in electron-beam excited semiconductors von Kyser, D.F., Wittry, D.B.

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Use of Electron Probes in the Study of Recombination Radiation von Wittry, David B., Kyser, David F.

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