Treffer 1 - 8 von 8 für Suche 'Kyoung, Jaisun', Suchdauer: 0,43s Treffer weiter einschränken
  1. 1
    P‐260: Late‐News Poster: Doping Ratio Control of Organic Composite Layer in OELDs by Spectroscopic Ellipsometry

    P‐260: Late‐News Poster: Doping Ratio Control of Organic Composite Layer in OELDs by Spectroscopic Ellipsometry von Kyoung, Jaisun, Park, Younggil, Ahn, Nari


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  2. 2
    Ellipsometry for Pellicle-Covered Surface

    Ellipsometry for Pellicle-Covered Surface von Lee, Sangyouk, Kyoung, Jaisun, Song, Chulgi, Oh, Hyekeun, Jeong, Heejun, Shin, Dong-soo, An, Ilsin


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  3. 3
    METHOD FOR ANALYZING THIN FILM AND DEVICE FOR ANALYZING THIN FILM

    METHOD FOR ANALYZING THIN FILM AND DEVICE FOR ANALYZING THIN FILM von LEE, GIHYUN, KYOUNG, JAISUN

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  4. 4
    METHOD OF MEASURING FOR THIN FILM AND APPARATUS FOR MEASURING FOR THIN FILM

    METHOD OF MEASURING FOR THIN FILM AND APPARATUS FOR MEASURING FOR THIN FILM von LEE GIHYUN, KYOUNG JAISUN

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  5. 5
    SUBSTRATE PROCESSING APPARATUS AND METHOD OF MEASURING FILM THICKNESS

    SUBSTRATE PROCESSING APPARATUS AND METHOD OF MEASURING FILM THICKNESS von PARK, YOUNGGIL, JEONG, SOOIM, PARK, JONGYUN, HWANG, DEOKHYUN, KYOUNG, JAISUN

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  6. 6
    DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME

    DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME von Han, Jaebum, Jeong, Sooim, Kim, Moonsung, Kyoung, Jaisun, Kim, Kihyun, Park, Younggil

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  7. 7
    SUBSTRATE PROCESSING APPARATUS AND FILM THICKNESS MEASUREMENT METHOD

    SUBSTRATE PROCESSING APPARATUS AND FILM THICKNESS MEASUREMENT METHOD von PARK JONGYUN, JEONG SOOIM, PARK YOUNGGIL, HWANG DEOKHYUN, KYOUNG JAISUN

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  8. 8
    Patterning of Thin Copper Films under UV Exposure in Chlorine-Based Liquids

    Patterning of Thin Copper Films under UV Exposure in Chlorine-Based Liquids von Chattopadhyay K.K., 안일신, Cho Jongkyu, Kim Okkyung, Kwak Jiwoon, Kyoung Jaisun


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