In0.53Ga0.47As-Based nMOSFET Design for Low Standby Power Applications von Bhuwalka, Krishna K., Zhenhua Wu, Hyeon-Kyun Noh, Wonsok Lee, Cantoro, Mirco, Yeon-Cheol Heo, Seonghoon Jin, Woosung Choi, Uihui Kwon, Maeda, Shigenobu, Keun-Ho Lee, Young-Kwan Park

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Surface scattering impact on Si/TiSi2 contact resistance von Vuttivorakulchai, Kantawong, Pourghaderi, Mohammad Ali, Kim, Gwang-Jun, Song, Seunghyun, Kim, Yoon-Suk, Kwon, Uihui, Kim, Dae Sin

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Switchable Chemical‐Bond Reorganization for the Stable Charge Trapping in Amorphous Silicon Nitride von Choi, Woon Ih, Son, Won‐Joon, Dronskowski, Richard, Oh, Youngtek, Yang, Seung‐Yeul, Kwon, Uihui, Kim, Dae Sin

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Simulation-based study on characteristics of dual vertical transfer gates in sub-micron pixels for CMOS image sensors von Lee, Wook, Ko, Seonghoon, Kim, Jae Ho, Kim, Yoon-Suk, Kwon, Uihui, Kim, HyunChul, Kim, Dae Sin

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Optimization of Photodiode Design Through Analysis of Full-Well Capacity and Image Lag in 0.5 μm CMOS Image Sensors With Vertical Transfer Gates von Park, Jae Hyeon, Suk, Chan Hee, Kim, Sungchul, Kim, Jae Ho, Kwon, Uihui, Kim, Dae Sin, Yoo, Keon-Ho, Kim, Tae Whan

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Critical Backscattering Length in Nanotransistors von Pourghaderi, M. Ali, Pham, Anh-Tuan, Park, Hong-Hyun, Jin, Seonghoon, Vuttivorakulchai, Kantawong, Park, Yonghee, Kwon, Uihui, Choi, Woosung, Kim, Dae Sin

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Ballisticity Saturation by Unscalable Reflections von Pourghaderi, M. Ali, Ilatikhameneh, Hesameddin, Pham, Anh-Tuan, Park, Hong-Hyun, Lim, Jinyoung, Jiang, Zhengping, Wang, Jing, Jin, Seonghoon, Kim, Jongchol, Kwon, Uihui, Chung, Won-Young, Choi, Woosung, Kim, Dae Sin

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Novel stress-memorization-technology (SMT) for high electron mobility enhancement of gate last high-k/metal gate devices von Kwan-Yong Lim, Hyunjung Lee, Choongryul Ryu, Kang-Ill Seo, Uihui Kwon, Seokhoon Kim, Jongwan Choi, Kyungseok Oh, Hee-Kyung Jeon, Chulgi Song, Tae-Ouk Kwon, Jinyeong Cho, Seunghun Lee, Yangsoo Sohn, Hong Sik Yoon, Junghyun Park, Kwanheum Lee, Wookje Kim, Eunha Lee, Sang-Pil Sim, Chung Geun Koh, Sang Bom Kang, Siyoung Choi, Chilhee Chung

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Method and apparatus for estimating aging of integrated circuit von Machida, Ken, Park, Yonghee, Choi, Jaehee, Monga, Udit, Kwon, Uihui

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Metal oxide semiconductor field-effect transistor (MOSFET) devices and manufacturing methods thereof von Kwon, Uihui, Yun, Sangjun, Kim, Seongnam, Ahn, Hyoshin

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METAL OXIDE SEMICONDUCTOR FIELD-EFFECT TRANSISTOR (MOSFET) DEVICES AND MANUFACTURING METHODS THEREOF von KIM, SEONGNAM, AHN, HYOSHIN, KWON, UIHUI, YUN, SANGJUN

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Metal oxide semiconductor field-effect transistor (MOSFET) devices and manufacturing methods thereof von Kwon, Uihui, Yun, Sangjun, Kim, Seongnam, Ahn, Hyoshin

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Semiconductor protection device von Kim, Junhyeok, Jeong, Dawon, Yoo, Jaehyun, Lee, Kyuok, Kwon, Uihui, Jeon, Yongwoo, Ko, Jaehyok

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SEMICONDUCTOR DEVICE von Kim, Munhyeon, Park, Yonghee, Ha, Daewon, Kwon, Uihui, You, Joohyung

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IMAGE SENSOR AND MANUFACTURING METHOD THEREOF von KIM, JAE HO, UM, CHANGYONG, KWON, UIHUI, KIM, SUNGCHUL

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INTEGRATED CIRCUIT DEVICE von KIM, Ahyoung, KIM, Seungkyu, KWON, Uihui, PARK, Yonghee, KANG, Myunggil, SONG, Youngseok

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Integrated circuit device von Park, Yonghee, Song, Youngseok, Kwon, Uihui, Kim, Seungkyu, Kang, Myunggil, Kim, Ahyoung

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IMAGE SENSOR von LEE, Wook, KIM, Jae Ho, KO, Seonghoon, KWON, Uihui

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Image sensor von Kim, Jaeho, Kim, Sungchul, Kim, Seoksan, Kwon, Uihui, Seo, Minwoong

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IMAGE SENSOR von KIM, JAE HO, KWON, UIHUI, LEE, KWANGHEE, SONG, EUIYOUNG

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