Optimizing De-Trap Pulses in Gate-Injection Type Ferroelectric NAND Cells to Minimize Read After Write Delay Issue von Kim, Giuk, Choi, Hyojun, Cho, Hongrae, Lee, Sangho, Shin, Hunbeom, Kang, Hyunjun, Kim, Hoon, Shin, Seokjoong, Park, Seonjae, Kwon, Sunseong, Lim, Youngjin, Kim, Kang, Min Chung, Jong, Oh, Il-Kwon, Ko Park, Sang-Hee, Ahn, Jinho, Jeon, Sanghun

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