PeopleSoft for the Oracle DBA von Kurtz, David

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A micromachined 585 GHz Schottky mixer von Hui, K., Hesler, J.L., Kurtz, D.S., Bishop, W.L., Crowe, T.W.

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Millimeter-wave sideband generation using varactor phase modulators von Kurtz, D.S., Hesler, J.L., Crowe, T.W., Weikle, R.M.

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Submillimeter-wave sideband generation using varactor Schottky diodes von Kurtz, D.S., Hesler, J.L., Crowe, T.W., Weikle, R.M.

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Solid-state sources, receivers and systems for plasma diagnostics and THz frequency extenders for VNAs von Hesler, J.L., Duan, Y., Kurtz, D.S., Crowe, T.W.

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THz Schottky diode harmonic mixers for QCL phase-locking von Bulcha, Berhanu T., Kurtz, David S., Groppi, Chris, Hesler, Jeffrey L., Barker, N. Scott

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Photo-sensor fiber-optic stress analysis system von KURTZ, DAVID S

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Apparatus for rapid in-situ X-ray stress measurement during thermal cycling of semiconductor wafers von KURTZ, DAVID S

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Photo-sensor fiber-optic stress analysis system von KURTZ, DAVID S

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BANKRUPTCY: THE DEVELOPMENT OF CASE LAW UNDER THE NEW CODE BEGINS von Kurtz, David S

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Submillimeter-wave sideband generation using a planar diode array von Kurtz, D.S., Hesler, J.L., Hacker, J.B., Crowe, T.W., Rutledge, D.B., Weikle, R.M.

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APPARATUS AND METHOD FOR TEXTURE ANALYSIS ON SEMICONDUCTOR WAFERS von KURTZ, DAVID, S, MORAN, PAUL, R, KOZACZEK, KRZYSZTOF, J

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Method and apparatus for rapid grain size analysis of polycrystalline materials von Kurtz, David S, Kozaczek, Kryzsztof J, Moran, Paul R

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Method and apparatus for rapid grain size analysis of polycrystalline materials von MORAN PAUL R, KOZACZEK KRYZSZTOF J, KURTZ DAVID S

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Frequency domain terahertz spectroscopy von Kurtz, D.S., Crowe, T.W., Hesier, J.L., Porterfield, D.W.

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QUANTITATIVE PHASE ANALYSIS OF TEXTURED POLYCRYSTALLINE MATERIALS von KURTZ, DAVID, S, MORAN, PAUL, R, MARTIN, ROGER, I, KOZACZEK, KRZYSZTOF, J

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QUANTITATIVE PHASE ANALYSIS OF TEXTURED POLYCRYSTALLINE MATERIALS von KURTZ, DAVID, S, MORAN, PAUL, R, MARTIN, ROGER, I, KOZACZEK, KRZYSZTOF, J

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Large angle solid state position sensitive x-ray detector system von RUUD, CLAY O, KURTZ, DAVID S

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Large angle solid state position sensitive x-ray detector system von RUUD, CLAY O, KURTZ, DAVID S

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Method and apparatus for rapid grain size analysis of polycrystalline materials von MORAN PAUL R, KOZACZEK KRZYSZTOF J, KURTZ DAVID S

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