Optical Measuring and Laser Technologies for Scientific and Industrial Applications von Chugui, Yuri V., Verkhoglyad, Alexander G., Zavyalov, Petr S., Sysoev, Evgeny V., Kulikov, Rodion V., Vykhristyuk, Ignat A., Zavyalova, Marina A., Poleshchuk, Alexander G., Korolkov, Victor P.

Volltext

Improvement of Lateral Resolution of 3D-Relief Interferometric Measurement by Deconvolution von Sysoev, Evgeny V., Vykhristyuk, Ignat A., Kulikov, Rodion V., Shirokov, Vasiliy V.

Volltext

Application of 3D Nanorelief Sharp-Edge Detection Method in the Optical Interference Microscope von Fan, Kuang Chao, Vykhristyuk, Ignat A., Kulikov, Rodion V., Chen, Liang Chia, Hai, Hoang Hong, Sysoev, Evgeny V., Chugui, Yuri V.

Volltext

Microrelief Measurements for White-Light Interferometer with Adaptive Algorithm Interferogram Processing von Kulikov, Rodion V., Sysoev, Evgeny V.

Volltext