Models of processes accompanying crystallization of supercooled droplets von Amelyushkin, Ivan, Kudrov, Maksim, Morozov, Alexey, Stasenko, Albert, Shcheglov, Andrey

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Mathematical models and methods of numerical investigation of processes which accompany aircraft icing von Amelyushkin, Ivan Alekseevich, Kudrov, Maksim Aleksandrovich, Morozov, Alexey Olegovich, Shcheglov, Andrey Sergeevich

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Development of the flagmanFoam Solver for Modeling Aircraft Icing in Conditions of Small Droplet Inflow von Vatutin, Kirill Alexandrovich, Kraposhin, Matvey Viktorovich, Kudrov, Maksim Aleksandrovich, Miller, Alexey Borisovich, Melnikova, Valeriia Gennadievna, Sautkina, Sofya Mikhailovna, Morozov, Alexey Olegovich, Shevelyov, Alexander Alekseevich

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HARDWARE AND SOFTWARE PLATFORM OF THE HARDWARE-IN-THE-LOOP SIMULATION STAND FOR TESTING THE UNMANNED AERIAL VEHICLE COMPUTER von Gorbunkov Leonid Evgenevich, Bugaev Vasilii Sergeevich, Bukharov Kirill Dmitrievich, Kudrov Maksim Aleksandrovich

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Calorimetric stand for research of processes in the refrigeration unit von Kudrov, Yu. V., Sumzina, L. V., Maksimov, A. V., Filimonov, S. L.

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Improvement of methods for utilization of sewage sludge von Gubanov, Nikolai, Maksimov, Alexander, Kudrov, Yury

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The features of the process of throttling of the refrigerant in the capillary tubes von Maksimov, Aleksandr, Kudrov, Jurij, Ravilov, Farid, Burceva, Ljudmila

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Method for Refrigerators Efficiency Increasing von Suchilin, V A, Sumzina, L V, Maksimov, A V

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Method for Household Refrigerators Efficiency Increasing von Lebedev, V V, Sumzina, L V, Maksimov, A V

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WaferSegClassNet - A light-weight network for classification and segmentation of semiconductor wafer defects von Nag, Subhrajit, Makwana, Dhruv, R, Sai Chandra Teja, Mittal, Sparsh, Mohan, C.Krishna

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Semantic Segmentation for Noisy and Limited Wafer Transmission Electron Microscope Images von Jo, Yongwon, Bae, Jinsoo, Cho, Hansam, Roh, Heejoong, Kim, Kyunghye, Jo, Munki, Tae, Jaeung, Bum Kim, Seoung

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A novel approach for wafer defect pattern classification based on topological data analysis von Ko, Seungchan, Koo, Dowan

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A systemic comparison between using augmented data and synthetic data as means of enhancing wafermap defect classification von Alqudah, Rajaa, Al-Mousa, Amjed A., Abu Hashyeh, Yazan, Alzaibaq, Omar Z.

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Evaluation of the impact of covid crisis on Russian Regional economies von Ledneva, O., Loseva, A., Tsypin, A.

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WDP-BNN: Efficient wafer defect pattern classification via binarized neural network von Zhang, Qing, Zhang, Yuhang, Li, Jizuo, Li, Yongfu

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Wafer map failure pattern classification using geometric transformation-invariant convolutional neural network von Jeong, Iljoo, Lee, Soo Young, Park, Keonhyeok, Kim, Iljeok, Huh, Hyunsuk, Lee, Seungchul

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TripletMatch: Wafer Map Defect Detection Using Semi-Supervised Learning and Triplet Loss With Mixup von Lim, Changjin, Hur, Youngbum

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Improved wafer map defect pattern classification using automatic data augmentation based lightweight encoder network in contrastive learning von Sheng, Yi, Yan, Jinda, Piao, Minghao

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Right to University Education in the Czech Republic von Kudrová, Veronika

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Development of a spatial dimension-based taxonomy for classifying the defect patterns in a wafer bin map von Choi, Seung-Hyun, Lee, Dong-Hee, Kim, Eun-Su, Bae, Young-Mok, Oh, Young-Chan, Kim, Kwang-Jae

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