Improved geometry of double-sided polished parallel wafers prepared for direct wafer bonding von Haisma, J, van der Kruis, F J, Spierings, B A, Baalbergen, J J, Bijsterveld, B H, Brehm, R, Faasen, J H, Groenen, J J, de Haas, P W, Haddeman, T B, Michielsen, T M, Vijfvinkel, J

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Sputter deposited carbon tested as RIE intermediate for HSQ and its CMP reversed patterns von van Delft, Falco, Heuvel, Eric van den, Kruis, Frank van der, Maas, Martien, Rodriguez, Francisco Gonzalez, Buul, Jeroen van, Laar, Robert van de, Win, Ton de, Naburgh, Emile, Holthuysen, Frans

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Damage-free tribochemical polishing of diamond at room temperature: a finishing technology von Haisma, Jan, van der Kruis, Frank J.H.M., Spierings, Bert A.C.M., Oomen, Jo M., Fey, Fons M.J.G.

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Major differences in clinical presentation, diagnosis and management of men and women with autosomal inherited bleeding disorders von Atiq, F., Saes, J.L., Punt, M.C., van Galen, K.P.M., Schutgens, R.E.G., Meijer, K., Cnossen, M.H., Laros-Van Gorkom, B.A.P., Peters, M., Nieuwenhuizen, L., Kruip, M.J.H.A., de Meris, J., van der Bom, J.G., van der Meer, F.J.M., Fijnvandraat, K., Kruis, I.C., van Heerde, W.L., Eikenboom, H.C.J., Leebeek, Frank W.G., Schols, S.E.M.

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Silicon-wafer fabrication and (potential) applications of direct-bonded silicon von Haisma, Jan, Michielsen, Theo M., van der Kruis, Frank J.H.M.

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Major differences in clinical presentation, diagnosis and management of men and women with autosomal inherited bleeding disorders von Atiq, F., Saes, J.L., Punt, M.C., van Galen, K.P.M., Schutgens, R.E.G., Meijer, K., Cnossen, M.H., Laros-Van Gorkom, B.A.P., Peters, M., Nieuwenhuizen, L., Kruip, M.J.H.A., de Meris, J., van der Bom, J.G., van der Meer, F.J.M., Fijnvandraat, K., Kruis, I.C., van Heerde, W.L., Eikenboom, H.C.J., Leebeek, Frank W.G., Schols, S.E.M.

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