Source point calibration from an arbitrary electron backscattering pattern von KRIEGER LASSEN, N. C.

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On the statistical analysis of orientation data von Krieger Lassen, N. C., Juul Jensen, D., Conradsen, K.

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Application of high-energy synchrotron radiation for texture studies von Mishin, O. V., Lauridsen, E. M., Krieger Lassen, N. C., Brückner, G., Tschentscher, T., Bay, B., Juul Jensen, D., Poulsen, H. F.

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Unsupervised approval criteria for automated EBSP investigation of deformed metals von Godfrey, Lassen, N. C. Krieger

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Automatic high‐precision measurements of the location and width of Kikuchi bands in electron backscatter diffraction patterns von Krieger Lassen

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Automatic recognition of deformed and recrystallized regions in partly recrystallized samples using electron back scattering patterns von Krieger Lassen, N C, Jensen, D Juul, Conradsen, K

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Through-Thickness Texture Variations Determined Non-Destructively by High Energy Synchrotron Radiation von Poulsen, Henning Friis, Krieger Lassen, N.C., Juul Jensen, Dorte, Garbe, S., Raabe, Dierk

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Automatic recognition of deformed and recrystallized regions in partly recrystallized samples using electron back scattering patterns von Krieger Lassen, N C, Juul Jensen, D, Conradsen, K

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A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns von Krieger Lassen, N.C.

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