A thin film model von Krichevets, Yu. M., Titarenko, I. M.

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Harrison pseudo-hamiltonian and nonstandard matching conditions von Titarenko, I. M., Mikolaichuk, A. G., Krichevets, Yu. M.

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Temperature field in a halfspace with a parallelepiped-shaped heat-releasing inclusion von Kolyano, Yu. M., Krichevets, Yu. M., Ivanik, E. G., Gavrysh, V. I.

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Temperature field in a half-space with a foreign inclusion von Kolyano, Yu. M., Krichevets, Yu. M., Ivanik, E. G., Gavrysh, V. I.

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Fundamental problems in the metrological assurance of modern information-processing measurement systems von Krichevets, A. M., Kalitsinskii, Yu. R.

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Features of automated systems as objects of metrological assurance von Kalitsinskii, Yu. R., Krichevets, A. M.

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Methodology for metrological support of automated measurement information systems for determining length of telephone connections von Kalitsinskii, Yu. R., Kolpak, B. D., Krichevets, A. M.

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Standard program for metrological validation of information measurement system software von Kolpak, B. D., Kalitsinskii, Yu. R., Krichevets, A. M.

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State and prospects of development of the standardization and technical base of metrological provisions for IMS von Kalitsinskii, Yu. R., Kolpak, B. D., Krichevets, A. M., Pinchevskii, A. D., Rechkov, G. A., Semenyuk, A. L.

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