Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction von Müller, Knut, Krause, Florian F., Béché, Armand, Schowalter, Marco, Galioit, Vincent, Löffler, Stefan, Verbeeck, Johan, Zweck, Josef, Schattschneider, Peter, Rosenauer, Andreas

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Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy von Müller-Caspary, Knut, Krause, Florian F., Grieb, Tim, Löffler, Stefan, Schowalter, Marco, Béché, Armand, Galioit, Vincent, Marquardt, Dennis, Zweck, Josef, Schattschneider, Peter, Verbeeck, Johan, Rosenauer, Andreas

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Ultrathin Au-Alloy Nanowires at the Liquid–Liquid Interface von Chatterjee, Dipanwita, Shetty, Shwetha, Müller-Caspary, Knut, Grieb, Tim, Krause, Florian F, Schowalter, Marco, Rosenauer, Andreas, Ravishankar, Narayanan

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Material Discrimination in Nanoparticle Hetero‐Aggregates by Analysis of Scanning Transmission Electron Microscopy Images von Gerken, Beeke, Mahr, Christoph, Stahl, Jakob, Grieb, Tim, Schowalter, Marco, Krause, Florian F., Mehrtens, Thorsten, Mädler, Lutz, Rosenauer, Andreas

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Sample tilt effects on atom column position determination in ABF–STEM imaging von Zhou, Dan, Müller-Caspary, Knut, Sigle, Wilfried, Krause, Florian F., Rosenauer, Andreas, van Aken, Peter A.

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Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction von Mahr, Christoph, Müller-Caspary, Knut, Ritz, Robert, Simson, Martin, Grieb, Tim, Schowalter, Marco, Krause, Florian F., Lackmann, Anastasia, Soltau, Heike, Wittstock, Arne, Rosenauer, Andreas

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Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction von Mahr, Christoph, Müller-Caspary, Knut, Grieb, Tim, Schowalter, Marco, Mehrtens, Thorsten, Krause, Florian F., Zillmann, Dennis, Rosenauer, Andreas

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Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence von Grieb, Tim, Krause, Florian F., Schowalter, Marco, Zillmann, Dennis, Sellin, Roman, Müller-Caspary, Knut, Mahr, Christoph, Mehrtens, Thorsten, Bimberg, Dieter, Rosenauer, Andreas

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Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation von Grieb, Tim, Tewes, Moritz, Schowalter, Marco, Müller-Caspary, Knut, Krause, Florian F., Mehrtens, Thorsten, Hartmann, Jean-Michel, Rosenauer, Andreas

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Atom counting based on Voronoi averaged STEM intensities using a crosstalk correction scheme von Krause, Florian F., Rosenauer, Andreas

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Characterization of mixing in nanoparticle hetero‐aggregates by convolutional neural networks von Mahr, Christoph, Stahl, Jakob, Gerken, Beeke, Baric, Valentin, Frei, Max, Krause, Florian F., Grieb, Tim, Schowalter, Marco, Mehrtens, Thorsten, Kruis, Einar, Mädler, Lutz, Rosenauer, Andreas

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Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential von Mahr, Christoph, Grieb, Tim, Krause, Florian F., Schowalter, Marco, Rosenauer, Andreas

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GaN atomic electric fields from a segmented STEM detector: Experiment and simulation von Grieb, Tim, Krause, Florian F., Mehrtens, Thorsten, Mahr, Christoph, Gerken, Beeke, Schowalter, Marco, Freitag, Bert, Rosenauer, Andreas

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Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods von Mahr, Christoph, Müller-Caspary, Knut, Grieb, Tim, Krause, Florian F., Schowalter, Marco, Rosenauer, Andreas

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Characterization of structure and mixing in nanoparticle hetero-aggregates using convolutional neural networks: 3D-reconstruction versus 2D-projection von Mahr, Christoph, Stahl, Jakob, Gerken, Beeke, Krause, Florian F., Schowalter, Marco, Grieb, Tim, Mädler, Lutz, Rosenauer, Andreas

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Dose efficient annular bright field contrast with the ISTEM method: A proof of principle demonstration von Krause, Florian F., Schowalter, Marco, Gerken, Beeke, Marquardt, Dennis, Grieb, Tim, Mehrtens, Thorsten, Mahr, Christoph, Rosenauer, Andreas

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Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose von Müller-Caspary, Knut, Krause, Florian F., Winkler, Florian, Béché, Armand, Verbeeck, Johan, Van Aert, Sandra, Rosenauer, Andreas

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Effects of instrument imperfections on quantitative scanning transmission electron microscopy von Krause, Florian F., Schowalter, Marco, Grieb, Tim, Müller-Caspary, Knut, Mehrtens, Thorsten, Rosenauer, Andreas

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Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaN von Krause, Florian F., Bredemeier, Dennis, Schowalter, Marco, Mehrtens, Thorsten, Grieb, Tim, Rosenauer, Andreas

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Accuracy and precision of position determination in ISTEM imaging of BaTiO3 von Marquardt, Dennis, Schowalter, Marco, Krause, Florian F., Grieb, Tim, Mahr, Christoph, Mehrtens, Thorsten, Rosenauer, Andreas

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