Effect of Tin on the processes of Silicon-nanocrystal formation in Amorphous Si[O.sub.x] thin-film matrices von Voitovych, V.V, Rudenko, R.M, Kolosiuk, A.G, Krasko, M.M, Juhimchuk, V.O, Voitovych, M.V, Ponomarov, S.S, Kraitchinskii, A.M, Povarchuk, V. Yu, Makara, V.A

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Effect of Tin on Structural Transformations in the Thin-Film Silicon Suboxide Matrix von Voitovych, V.V., Rudenko, R.M., Yuchymchuk, V.O., Voitovych, M.V., Krasko, M.M., Kolosiuk, A.G., Povarchuk, V.Yu, Khachevich, I.M., Rudenko, M.P.

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Influence of Tin Impurity on Degradation of Conductivity in Electron-Irradiated n-Si von Kras’ko, M.M.

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Behavior of Hydrogen During Crystallization of Thin Silicon Films Doped with Tin von Rudenko, R.M., Kras’ko, M.M., Voitovych, V.V., Kolosyuk, A.G., Povarchuk, V.Yu, Kraichynskyi, A.M., Yukhymchuck, V.O., Bratus’, V.Ya, Voitovych, M.V., Zaloilo, I.A.

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Influence of High Temperature Annealing on the Structure and the Intrinsic Absorption Edge of Thin-Film Silicon Doped with Tin von Rudenko, R.M., Voitovych, V.V., Kras’ko, M.M., Kolosyuk, A.G., Kraichynskyi, A.M., Yukhymchuk, V.O., Makara, V.A.

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