A statistical interpretation of molecular delta layer depth profiles von Wucher, A., Krantzman, K.D., Lu, C., Winograd, N.

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Molecular dynamics simulations to explore the effect of chemical bonding in the keV bombardment of Si with C60, Ne60 and 12Ne60 projectiles von Krantzman, K.D., Garrison, B.J.

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Sputtered neutral SinCm clusters as a monitor for carbon implantation during C60 bombardment of silicon von Wucher, A., Kucher, A., Winograd, N., Briner, C.A., Krantzman, K.D.

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Cluster induced chemistry at solid surfaces: Molecular dynamics simulations of keV C60 bombardment of Si von Krantzman, K.D., Kingsbury, D.B., Garrison, Barbara J.

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Sputtered neutral Si n C m clusters as a monitor for carbon implantation during C 60 bombardment of silicon von Wucher, A., Kucher, A., Winograd, N., Briner, C.A., Krantzman, K.D.

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Cluster induced chemistry at solid surfaces: Molecular dynamics simulations of keV C 60 bombardment of Si von Krantzman, K.D., Kingsbury, D.B., Garrison, Barbara J.

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A statistical analysis of the lateral displacement of Si atoms in molecular dynamics simulations of successive bombardment with 20-keV C60 projectiles von Krantzman, K.D., Cook, E.L., Wucher, A., Garrison, B.J.

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Theoretical simulations of atomic and polyatomic bombardment of an organic overlayer on a metallic substrate von Krantzman, K.D., Fenno, R., Delcorte, A., Garrison, B.J.

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Big molecule ejection—SIMS vs. MALDI von Garrison, B.J., Delcorte, A., Zhigilei, L.V., Itina, T.E., Krantzman, K.D., Yingling, Y.G., McQuaw, C.M., Smiley, E.J., Winograd, N.

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A computational study of the imaging of a molecular crystal with the atomic force microscope von Krantzman, Kristin D, Rees, Douglas C, Farrelly, David

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SEMICLASSICAL MECHANICS OF THE QUADRATIC ZEEMAN EFFECT von KRANTZMAN, KD, MILLIGAN, JA, FARRELLY, D

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