Robustness of LDMOS power transistors in SOI-BCD processes and derivation of design rules using thermal simulation von Krabbenborg, B.H., Van der Pol, J.A.

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Layout to circuit extraction for three-dimensional thermal-electrical circuit simulation of device structures von Krabbenborg, B.H., Bosma, A., de Graaff, H.C., Mouthaan, A.J.

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Fast thermal cycling-enhanced electromigration in power metallization von Nguyen, H.V., Salm, C., Krabbenborg, B.H., Bisschop, J., Mouthaan, A.J.T., Kuper, F.G.

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Nonisothermal device simulation using the 2D numerical process/device simulator TRENDY and application to SOI-devices von Wolbert, P.B.M., Wachutka, G.K.M., Krabbenborg, B.H., Mouthaan, T.J.

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