High-quality and highly oriented graphite block from polycondensation polymer films von Murakami, M, Nishiki, N, Nakamura, K, Ehara, J, Okada, H, Kouzaki, T, Watanabe, K, Hoshi, T, Yoshimura, S

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Nucleation and growth mechanism of hemispherical grain polycrystalline silicon von MATSUO, N, OGAWA, H, KOUZAKI, T, OKADA, S

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Evaluation of Pre-Amorphized Layer Thickness and Interface Quality of High-Dose Shallow Implanted Silicon by Spectroscopic Ellipsometry von Shibata, S, Kawase, F, Kitada, A, Kouzaki, T, Kitamura, A

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Thermally stable, low-leakage self-aligned titanium silicide junctions von YOSHIDA, T, OGAWA, S, OKUDA, S, KOUZAKI, T, TSUKAMOTO, K

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Thermal instability of the TiSi2/Si structure: Impurity effects von Ogawa, S., Yoshida, T., Kouzaki, T., Okuda, S., Tsukamoto, K.

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TEM specimen preparation of a phase–change optical disk von Kouzaki, T

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Evaluation by spectroscopic ellipsometryof Si amorphized layer thickness after implantation and solid phase re-growth at low annealing temperatures von Shibata, S, Kawase, F, Kitada, A, Kouzaki, T, Kitamura, A, Yamazawa, K, Arai, M, Nambu, Y, Izutani, H, Morita, T

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Morphology of the silicon implanted interface of a polysilicon/single crystal silicon structure von Okuda, S., Ogawa, S., Kouzaki, T., Yoshida, T., Toujou, F., Sinclair, R.

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Stacked film structured dependence of electromigration in Al-Cu interconnect terminated with W plug von Matsumoto, S., Etoh, R., Ohtsuka, T., Kouzaki, T., Ogawa, S.

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Visual field loss in patients with normal-tension glaucoma under topical nipradilol or timolol: Subgroup and subfield analyses of the nipradilol-timolol study von Araie, Makoto, Shirato, Shiroaki, Yamazaki, Yoshio, Kitazawa, Yoshiaki, Ohashi, Yasuo

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Noise Reduction in CoPt Thin-Film Media with SiO2 von Ryonai, H., Ishida, T., Tohma, K., Kouzaki, T.

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Interface microstructure of titanium thin-film/silicon single-crystal substrate correlated with electrical barrier heights von OGAWA, S.-I, KOUZAKI, T, YOSHIDA, T, SINCLAIR, R

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Dependence of thermal stability of the titanium silicide/silicon structure on impurities von OGAWA, S.-I, YOSHIDA, T, KOUZAKI, T

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Atomic-order planarization of ultrathin SiO2/Si(001) interfaces von NIWA, M, KOUZAKI, T, OKADA, K, UDAGAWA, M, SINCLAIR, R

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Quasi Yagi-Uda antenna array for detecting targets in a dielectric substrate von Kouzaki, T., Kimoto, K., Kubota, S., Toya, A., Sasaki, N., Kikkawa, T.

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Leakage degradation in n+ Si contact filled with selective chemical vapor deposition tungsten plug due to aluminum diffusion along the plug sidewall von FUJII, T, FUJITA, T, KOUZAKI, T

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Noise Reduction in CoPt Thin-Film Media with SiO2 von Ryonai, H., Ishida, T., Tohma, K., Kouzaki, T.

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Structure and electrical properties of interfaces between silicon films and n+ silicon crystals von OGAWA, S, OKUDA, S, YOSHIDA, T, KOUZAKI, T, TSUKAMOTO, K, SINCLAIR, R

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Thermal instaiblity of the TiSi2/Si structure: impurity effects von OGAWA, S, YOSHIDA, T, KOUZAKI, T, OKUDA, S, TSUKAMOTO, K

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HREM analysis of ultra-thin oxides von Sinclair, R., Niwa, M., Kouzaki, T.

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