Low-Cost, High-Gain MoS2 FETs from Amorphous Low-Mobility Film Precursors von Balliou, Angelika, Papadimitropoulos, Giorgos, Regoutz, Anna, Davazoglou, Dimitris, Kouvatsos, Dimitrios N

Volltext

Electrical characteristics of vapor deposited amorphous MoS2 two-terminal structures and back gate thin film transistors with Al, Au, Cu and Ni-Au contacts von Kouvatsos, Dimitrios N., Papadimitropoulos, George, Spiliotis, Thanassis, Vasilopoulou, Maria, Barreca, Davide, Gasparotto, Alberto, Davazoglou, Dimitris

Volltext

Characterization of double gate TFTs fabricated in advanced SLS ELA polycrystalline silicon films von Kouvatsos, Dimitrios N., Farmakis, Filippos V., Moschou, Despina C., Kontogiannopoulos, Giannis P., Papaioannou, George J., Voutsas, Apostolos T.

Volltext

Hot-wire vapor deposition of amorphous MoS2 thin films von Papadimitropoulos, Georgios, Vourdas, Nikolaos, Kontos, A., Vasilopoulou, Maria, Kouvatsos, Dimitrios N., Boukos, Nicolas, Gasparotto, Alberto, Barreca, Davide, Davazoglou, Dimitrios

Volltext

Hot-carrier stress induced degradation of SLS ELA polysilicon TFTs – Effects of gate width variation and device orientation von Kontogiannopoulos, Giannis P., Farmakis, Filippos V., Kouvatsos, Dimitrios N., Papaioannou, George J., Voutsas, Apostolos T.

Volltext

On the optical properties of SLS ELA polycrystalline silicon films von Moschou, Despina C., Vourdas, Nikolaos, Davazoglou, Dimitrios, Kouvatsos, Dimitrios N., Vamvakas, Vassilis Emm, Voutsas, Apostolos T.

Volltext

On-state and off-state stress-induced degradation in unhydrogenated solid phase crystallized polysilicon thin film transistors von Kouvatsos, Dimitrios N

Volltext

Vg,max−Vth: A new electrical characterization parameter reflecting the polysilicon film quality of LTPS TFTs von Moschou, Despina C., Farmakis, Filippos V., Kouvatsos, Dimitrios N., Voutsas, Apostolos T.

Volltext

A Practical Model Assessing the Degradation of Polycrystalline Silicon TFTs Due to DC Electrical Stress von Kontogiannopoulos, Giannis P., Farmakis, Filippos V., Kouvatsos, Dimitrios N., Papaioannou, George J., Voutsas, Apostolos T.

Volltext

On the importance of the Vg,max―Vth parameter on LTPS TFT stressing behavior von MOSCHOU, Despina C, KONTOGIANNOPOULOS, Giannis P, KOUVATSOS, Dimitrios N, VOUTSAS, Apostolos T

Volltext

Characteristics of MOS diodes fabricated using sputter-deposited W or Cu/W films von Tsevas, Spiros, Vasilopoulou, Maria, Kouvatsos, Dimitrios N., Speliotis, Thanassis, Niarchos, Dimitris

Volltext

The effect of crystallization technology and gate insulator deposition method on the performance and reliability of polysilicon TFTs von Moschou, Despina C., Kontogiannopoulos, Giannis P., Kouvatsos, Dimitrios N., Voutsas, Apostolos T.

Volltext

Low-Cost, High-Gain MoS 2 FETs from Amorphous Low-Mobility Film Precursors von Balliou, Angelika, Papadimitropoulos, Giorgos, Regoutz, Anna, Davazoglou, Dimitris, Kouvatsos, Dimitrios N.

Volltext

High-performance thin-film transistors in large grain size polysilicon deposited by thermal decomposition of disilane von Kouvatsos, D.N., Voutsas, A.T., Hatalis, M.K.

Volltext

Electrical characteristics of vapor deposited amorphous MoS 2 two‐terminal structures and back gate thin film transistors with Al, Au, Cu and Ni‐Au contacts von Kouvatsos, Dimitrios N., Papadimitropoulos, George, Spiliotis, Thanassis, Vasilopoulou, Maria, Barreca, Davide, Gasparotto, Alberto, Davazoglou, Dimitris

Volltext

Electrical characteristics of vapor deposited amorphous MoS sub(2) two-terminal structures and back gate thin film transistors with Al, Au, Cu and Ni-Au contacts von Kouvatsos, Dimitrios N, Papadimitropoulos, George, Spiliotis, Thanassis, Vasilopoulou, Maria, Barreca, Davide, Gasparotto, Alberto, Davazoglou, Dimitris

Volltext

Hot-wire vapor deposition of amorphous MoS sub(2) thin films von Papadimitropoulos, Georgios, Vourdas, Nikolaos, Kontos, A, Vasilopoulou, Maria, Kouvatsos, Dimitrios N, Boukos, Nicolas, Gasparotto, Alberto, Barreca, Davide, Davazoglou, Dimitrios

Volltext

Hot‐wire vapor deposition of amorphous MoS 2 thin films von Papadimitropoulos, Georgios, Vourdas, Nikolaos, Kontos, A., Vasilopoulou, Maria, Kouvatsos, Dimitrios N., Boukos, Nicolas, Gasparotto, Alberto, Barreca, Davide, Davazoglou, Dimitrios

Volltext

Short Channel Effects on LTPS TFT Degradation von Moschou, Despina C., Theodorou, Christoforos G., Hastas, Nikolaos A., Tsormpatzoglou, Andreas, Kouvatsos, Dimitrios N., Voutsas, Apostolos T., Dimitriadis, Charalabos A.

Volltext

Polycrystalline silicon thin film transistors fabricated at reduced thermal budgets by utilizing fluorinated gate oxidation von Kouvatsos, D.N., Hatalis, M.K.

Volltext