Effect of silicon thickness on the degradation mechanisms of sequential laterally solidified polycrystalline silicon TFTs during hot-carrier stress von Voutsas, A.T., Kouvatsos, D.N., Michalas, L., Papaioannou, G.J.

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Gate/drain bias-induced degradation effects in TFTs fabricated in unhydrogenated SPC polycrystalline silicon films von Kouvatsos, D.N., Davazoglou, D.

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Charging effects in silicon nanocrystals embedded in SiO2 films von Kouvatsos, D.N., Ioannou-Sougleridis, V., Nassiopoulou, A.G.

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Photo- and electroluminescence from nanocrystalline silicon single and multilayer structures von Photopoulos, P, Nassiopoulou, A.G, Kouvatsos, D.N, Travlos, A

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High-performance thin-film transistors in large grain size polysilicon deposited by thermal decomposition of disilane von Kouvatsos, D.N., Voutsas, A.T., Hatalis, M.K.

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Hydrogen passivation on Sequential Lateral Solidified poly-Si TFTs von Michalas, L., Koutsoureli, M., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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Back gate influence on front channel operation of p-channel double gate polysilicon TFTs von Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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On the study of p-channel thin-film transistors fabricated by SLS ELA crystallization techniques von Exarchos, M.A., Moschou, D.C., Papaioannou, G.J., Kouvatsos, D.N., Arapoyanni, A., Voutsas, A.T.

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Polycrystalline silicon thin film transistors fabricated at reduced thermal budgets by utilizing fluorinated gate oxidation von Kouvatsos, D.N., Hatalis, M.K.

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Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors von Davidović, V., Kouvatsos, D.N., Stojadinović, N., Voutsas, A.T.

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Investigation of the undershoot effect in polycrystalline silicon thin film transistors von Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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Device degradation behavior and polysilicon film morphology of thin film transistors fabricated using advanced excimer laser lateral solidification techniques von Kouvatsos, D.N., Voutsas, A.T., Michalas, L., Farmakis, F.V., Papaioannou, G.J.

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Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques von Moschou, D.C., Exarchos, M.A., Kouvatsos, D.N., Papaioannou, G.J., Voutsas, A.T.

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An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors von Michalas, L., Exarchos, M., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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A novel SLS ELA crystallization process and its effects on polysilicon film defectivity and TFT performance von Moschou, Despina C., Exarchos, M.A., Kouvatsos, D.N., Papaioannou, G.J., Voutsas, A.T.

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Influence of a high electric field on the photoluminescence from silicon nanocrystals in SiO2 von Ioannou-Sougleridis, V., Kamenev, B., Kouvatsos, D.N., Nassiopoulou, A.G.

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Characterization of thin film transistors fabricated on different sequential lateral solidified poly-silicon substrates von Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Farmakis, F.V., Voutsas, A.T.

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Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress von Farmakis, F.V., Kontogiannopoulos, G.P., Kouvatsos, D.N., Voutsas, A.T.

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Charging effects in silicon nanocrystals embedded in SiO 2 films von Kouvatsos, D.N., Ioannou-Sougleridis, V., Nassiopoulou, A.G.

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Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique von Moschou, D.C., Exarchos, M.A., Kouvatsos, D.N., Papaioannou, G.J., Arapoyanni, A., Voutsas, A.T.

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