Fluence evolution of defects in α-SiO2 determined by ionoluminescence von Szilágyi, E., Pal, M.K., Kótai, E., Zolnai, Z., Bányász, I.

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Ion-beam analysis of insulator samples von Szilágyi, E., Kótai, E., Merkel, D.G.

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Channelling study of La1−xSrxCoO3 films on different substrates von Szilágyi, E., Kótai, E., Rata, D., Németh, Z., Vankó, G.

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Determination of migration of ion-implanted helium in silica by proton backscattering spectrometry von Szakacs, G, Szilagyi, E, Paszti, F, Kotai, E

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A 3D-RBS study of irradiation-induced deformation and masking properties of ordered colloidal nanoparticulate masks von Zolnai, Z., Deák, A., Nagy, N., Tóth, A.L., Kótai, E., Battistig, G.

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Nondestructive atomic compositional analysis of BeMgZnO quaternary alloys using ion beam analytical techniques von Zolnai, Z., Toporkov, M., Volk, J., Demchenko, D.O., Okur, S., Szabó, Z., Özgür, Ü., Morkoç, H., Avrutin, V., Kótai, E.

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Computer methods for analysis and simulation of RBS and ERDA spectra von Kótai, E.

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International Atomic Energy Agency intercomparison of ion beam analysis software von Barradas, N.P., Arstila, K., Battistig, G., Bianconi, M., Dytlewski, N., Jeynes, C., Kótai, E., Lulli, G., Mayer, M., Rauhala, E., Szilágyi, E., Thompson, M.

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Structural effects induced by 2.5 MeV proton beam on zeolite 4A: Positron annihilation and X-ray diffraction study von Tuyen, L A, Szilagyi, E, Kotai, E, Lazar, K, Bottyan, L, Dung, T Q, Cuong, L C, Khiem, D D, Phuc, P T, Nguyen, L L, Hue, P T, Hue, N T N, Tao, C V, Chuong, H D

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Summary of “IAEA intercomparison of IBA software” von Barradas, N.P., Arstila, K., Battistig, G., Bianconi, M., Dytlewski, N., Jeynes, C., Kótai, E., Lulli, G., Mayer, M., Rauhala, E., Szilágyi, E., Thompson, M.

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Variability of Pyrenophora Teres F. Teres in Hungary as revealed by mating type and RAPD analyses von Ficsor, A, Toth, B, Varga, J, Csosz, M, Tomcsanyi, A, Meszaros, K, Kotai, E, Bakonyi, J

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Damage accumulation in nitrogen implanted 6H-SiC: Dependence on the direction of ion incidence and on the ion fluence von Zolnai, Z., Ster, A., Khánh, N. Q., Battistig, G., Lohner, T., Gyulai, J., Kótai, E., Posselt, M.

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Channelling study of La1- x Sr x CoO3 films on different substrates von Szilagyi, E, Kotai, E, Rata, D, Nemeth, Z, Vanko, G

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Measurement of the stopping powers for channeled ions in ion implanted single crystals von Kótai, E.

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Lithium concentration dependence of implanted helium retention in lithium silicates von SzAa'cs, DE, Szilagyi, E, Bogdan, Cs, Kotai, E, Horvath, ZE

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Three-dimensional view of the shape, size, and atomic composition of ordered nanostructures by Rutherford backscattering spectrometry von Zolnai, Z., Nagy, N., Deák, A., Battistig, G., Kótai, E.

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Synthesis of cobalt silicide on porous silicon by high dose ion implantation von Ramos, A.R., Pászti, F., Kotai, E., Vázsonyi, É., Conde, O., da Silva, M.R., da Silva, M.F., Soares, J.C.

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Nanoscale morphology and photoemission of arsenic implanted germanium films von Petö, G., Khanh, N. Q., Horváth, Z. E., Molnár, G., Gyulai, J., Kótai, E., Guczi, L., Frey, L.

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Be- and Mg-ion implantation-induced damage in InSb von Declémy, A., Sauvage, T., Kotai, E., Lévêque, P., Abd El-Ati, M.I.

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Iron distribution in the implanted silicon under the action of high-power pulsed ion and laser beams von Bayazitov, R., Batalov, R., Nurutdinov, R., Shustov, V., Gaiduk, P., Dézsi, I., Kótai, E.

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