Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories von Korkian, Golnaz, Leon, Daniel, Franco, Francisco J., Fabero, Juan C., Letiche, Manon, Morilla, Yolanda, Martin-Holgado, Pedro, Puchner, Helmut, Mecha, Hortensia, Clemente, Juan A.

Volltext

Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode von Fabero, Juan Carlos, Mecha, Hortensia, Franco, Francisco J., Clemente, Juan Antonio, Korkian, Golnaz, Rey, Solenne, Cheymol, Benjamin, Baylac, Maud, Hubert, Guillaume, Velazco, Raoul

Volltext

Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests von Franco, Francisco J., Clemente, Juan A., Korkian, Golnaz, Fabero, Juan C., Mecha, Hortensia, Velazco, Raoul

Volltext

Experimental and Analytical Study of the Responses of Nanoscale Devices to Neutrons Impinging at Various Incident Angles von Korkian, Golnaz, Fabero, Juan Carlos, Hubert, Guillaume, Rezaei, Mohammadreza, Mecha, Hortensia, Franco, Francisco J., Puchner, Helmut, Clemente, Juan Antonio

Volltext

SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles von Fabero, Juan C., Korkian, Golnaz, Franco, Francisco J., Hubert, Guillaume, Mecha, Hortensia, Letiche, Manon, Clemente, Juan A.

Volltext

TA01-32: Developing techniques against the Single Event Effects (SEEs) in memories provoked in natural radiation environments von Korkian, Golnaz

Volltext bestellen