Precise Alignment of Single Nanowires and Fabrication of Nanoelectromechanical Switch and Other Test Structures von Qiliang Li, Sang-Mo Koo, Richter, C.A., Edelstein, M.D., Bonevich, J.E., Kopanski, J.J., Suehle, J.S., Vogel, E.M.

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Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement von Hong, Y.D., Yew Tong Yeow, Chim, W.-K., Kin-Mun Wong, Kopanski, J.J.

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Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy von Yang, J., Kopanski, J.J., Postula, A., Bialkowski, M.

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Test Chip to Evaluate Measurement Methods for Small Capacitances von Kopanski, J.J., Afridi, M.Y., Chong Jiang, Richter, C.A.

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Specific contact resistivity of metal-semiconductor contacts-a new, accurate method linked to spreading resistance von Carver, G.P., Kopanski, J.J., Novotny, D.B., Forman, R.A.

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High spatial resolution mapping of resistivity variations in semiconductors von Kopanski, J.J., Lowney, J.R., Miles, D.S., Novotny, D.B., Carver, G.P.

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Scanning Capacitance Microscopy for measuring device carrier profiles beyond the 100 nm generation von Kopanski, J.J., Marchiando, J.F., Rennex, B.G.

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Scanning probe techniques for the electrical characterization of semiconductor devices von Dagata, J.A, Kopanski, J.J

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