Reconstruction of depth resolved strain tensor in off-axis single crystals: Application to H+ ions implanted LiTaO3 von Louiset, Antonin, Schamm-Chardon, Sylvie, Kononchuk, Oleg, Cherkashin, Nikolay

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High temperature evolution of a confined silicon layer von Le Cunff, Maëlle, Rieutord, François, Landru, Didier, Kononchuk, Oleg, Cherkashin, Nikolay

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Surface self-diffusion of silicon during high temperature annealing von Acosta-Alba, Pablo E., Kononchuk, Oleg, Gourdel, Christophe, Claverie, Alain

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Experimental study of post-crack vibrations in dynamic fracture von Ronseaux, Pauline, Madeira, Florence, Mazen, Fredéric, Landru, Didier, Kononchuk, Oleg, Tardif, Samuel, Rieutord, François

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Silicon-on-Insulator (SOI) Technology - Manufacture and Applications von Kononchuk, O, Nguyen, B. Y

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Light scattering from dislocations in silicon von Monier, Vanessa, Capello, Luciana, Kononchuk, Oleg, Pichaud, Bernard

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High temperature evolution of interfacial metal film bonding two 4H-SiC substrates von Le Cunff, Maëlle, Rieutord, François, Landru, Didier, Kononchuk, Oleg, Cherkashin, Nikolay

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Reconstruction of depth resolved strain tensor in off-axis single crystals: Application to H + ions implanted LiTaO 3 von Louiset, Antonin, Schamm-Chardon, Sylvie, Kononchuk, Oleg, Cherkashin, Nikolay

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Influence of rapid thermal processing on carrier concentration in high resistivity silicon von Capello, Luciana, Bertrand, Isabelle, Kononchuk, Oleg

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Internal Dissolution of Buried Oxide in SOI Wafers von Kononchuk, Oleg, Allibert, Frederic, Boedt, Francois

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Electronic States of Oxygen-Free Dislocation Networks Produced by Direct Bonding of Silicon Wafers von Kononchuk, Oleg, Mchedlidze, Teimuraz, Kittler, Martin, Trushin, Maxim, Vyvenko, O.F.

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Brittle fracture studied by ultra‐high‐speed synchrotron X‐ray diffraction imaging von Petit, Antoine, Pokam, Sylvia, Mazen, Frederic, Tardif, Samuel, Landru, Didier, Kononchuk, Oleg, Ben Mohamed, Nadia, Olbinado, Margie P., Rack, Alexander, Rieutord, Francois

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In Situ Observation of Pressurized Microcrack Growth in Silicon von Colonel, Lucas, Mazen, Frédéric, Landru, Didier, Kononchuk, Oleg, Ben Mohamed, Nadia, Rieutord, François

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Interface water diffusion in silicon direct bonding von Tedjini, M., Fournel, F., Moriceau, H., Larrey, V., Landru, D., Kononchuk, O., Tardif, S., Rieutord, F.

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Gettering of Cu and Ni in mega-electron-volt ion-implanted epitaxial silicon von Koveshnikov, Sergei, Kononchuk, Oleg

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Ge Nano-Heteroepitaxy: From Nano-Pillars to Thick Coalesced Layers von Mastari, Marouane, Charles, Matthew, Pimenta-Barros, Patricia, Argoud, Maxime, Tiron, Raluca, Papon, Anne-Marie, Chevalier, Nicolas, Hartmann, Jean-Michel, Landru, Didier, Kim, Young-Pil, Kononchuk, Oleg

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Development of microcracks in hydrogen-implanted silicon substrates von Penot, Jean-Daniel, Massy, Damien, Rieutord, François, Mazen, Frederic, Reboh, Shay, Madeira, Florence, Capello, Luciana, Landru, Didier, Kononchuk, Oleg

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Fracture Wake Patterns in Brittle Solids von Landru, Didier, Massy, Damien, Mohamed, Nadia Ben, Kononchuk, Oleg, Mazen, Frederic, Tardif, Samuel, Rieutord, Francois

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(Invited) Defect Evolution during Silicon Smartcut von Rieutord, François, Tardif, Samuel, Mazen, Frédéric, Landru, Didier, Kononchuk, Oleg

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(Invited) Water Transport Along Si/Si Direct Wafer Bonding Interfaces von Rieutord, François, Tardif, Samuel, Nikitskiy, Ivan, Fournel, Frank, Tedjini, Marwan, Larrey, Vincent, Bridoux, Claudine, Morales, Christophe, Landru, Didier, Kononchuk, Oleg

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