Phase changes of the AISI 430 ferritic stainless steels after high-temperature gas nitriding and tempering heat treatment von Sung, J.H., Kong, J.H., Yoo, D.K., On, H.Y., Lee, D.J., Lee, H.W.

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Writing current reduction and total set resistance analysis in PRAM von Jeong, C.W., Kang, D.H., Ha, D.W., Song, Y.J., Oh, J.H., Kong, J.H., Yoo, J.H., Park, J.H., Ryoo, K.C., Lim, D.W., Park, S.S., Kim, J.I., Oh, Y.T., Kim, J.S., Shin, J.M., Park, Jaehyun, Fai, Y., Koh, G.H., Jeong, G.T., Jeong, H.S., Kim, Kinam

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Compared with various assisted reproductive technology birth of the baby's birth defects in 1,540 cases von Wang, F, Sun, P.Y, Kong, J.H, Su, C.Y, Guo, H.Y, Liang, Y.J

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976PHYPOCELLULAR MYELODYSPLASTIC SYNDROME IN THE HYPOMETHYLATING AGENT ERA von Hyun, S.Y., Kong, J.H., Shim, K.Y., Lee, J.I.

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973PPRETREATMENT LYMPHOPENIA AND POOR PERFORMANCE STATUS ARE RISK FACTORS OF SEVERE BACTERIAL INFECTION IN PATIENTS WITH MULTIPLE MYELOMA DURING CHEMOTHERAPY WITH BORTEZOMIB-CONTAI... von Lee, J.I., Hyun, S.Y., Kong, J.H., Shim, K.Y.

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Hypocellular Myelodysplastic Syndrome in the Hypomethylating Agent Era von Hyun, S.Y., Kong, J.H., Shim, K.Y., Lee, J.I.

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Pretreatment Lymphopenia and Poor Performance Status are Risk Factors of Severe Bacterial Infection in Patients with Multiple Myeloma During Chemotherapy with Bortezomib-Containing... von Lee, J.I., Hyun, S.Y., Kong, J.H., Shim, K.Y.

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PF324 RITUXIMAB DOSE ASSOCIATED WITH OVERALL SURVIVAL IN DIFFUSE LARGE B CELL LYMPHOMA von Kong, J.H., Kim, H.S., Lee, J.Y., Hyun, S.Y.

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Surface modification of SCM420 steel by plasma electrolytic treatment von Kong, J.H., Okumiya, M., Tsunekawa, Y., Takeda, T., Yun, K.Y., Yoshida, M., Kim, S.G.

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AlN and intermetallic compound layers formed between aluminum and austenitic stainless steel using barrel nitriding von Kong, J.H., Okumiya, M., Tsunekawa, Y., Kim, S.G., Yoshida, M.

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6508 A randomized phase II study of combination chemotherapy with epirubicin, cisplatin and capecitabine (ECX) or cisplatin and capecitabine (CX) in advanced gastric cancer (AGC):... von Yun, J.A, Kong, J.H, Kim, J.A, Lee, S.H, Lee, J.Y, Park, S.H, Park, J.O, Park, Y.S, Lim, H.Y, Kang, W.K

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Full Integration of Highly Manufacturable 512Mb PRAM based on 90nm Technology von Oh, J.H., Park, J.H., Lim, Y.S., Lim, H.S., Oh, Y.T., Kim, J.S., Shin, J.M., Song, Y.J., Ryoo, K.C., Lim, D.W., Park, S.S., Kim, J.I., Kim, J.H., Yu, J., Yeung, F., Jeong, C.W., Kong, J.H., Kang, D.H., Koh, G.H., Jeong, G.T., Jeong, H.S., Kinam Kim

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Two-bit cell operation in diode-switch phase change memory cells with 90nm technology von Kang, D-H., Lee, J.-H., Kong, J.H., Ha, D., Yu, J., Um, C.Y., Park, J.H., Yeung, F., Kim, J.H., Park, W.I., Jeon, Y.J., Lee, M.K., Song, Y.J., Oh, J.H., Jeong, G.T., Jeong, H.S.

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Very High Plastic Strain Zones in 304 Stainless Steel Small Punch Specimen Loaded at RT by Martensite Formation and Recrystallization Technique von Yu, Hyu Sun, Okumiya, Masahiro, Kong, J.H., Iino, Y.

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Thickness-dependent ferroelectric properties in fully-strained SrRUO3/BaTiO3/SrRUO3 ultra-thin capacitors von JO, J. Y, KIM, Y. S, NOH, T. W, KIM, D. H, KIM, J. D, CHANG, Y. J, KONG, J. H, PARK, Y. D, SONG, T. K, YOON, J.-G, JUNG, J. S

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Thickness-dependent ferroelectric properties in fully-strained SrRuO 3/BaTiO 3/SrRuO 3 ultra-thin capacitors von Jo, J.Y., Kim, Y.S., Kim, D.H., Kim, J.D., Chang, Y.J., Kong, J.H., Park, Y.D., Song, T.K., Yoon, J.-G., Jung, J.S., Noh, T.W.

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An improved water-use efficiency for winter wheat grown under reduced irrigation von Zhang, Jianhua, Sui, Xiangzhen, Li, Bin, Su, Baolin, Li, Jianmin, Zhou, Dianxi

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Fabrication and Thickness Dependent Properties of Ferroelectric Heterostructure von 김용수, 노태원, D.H. Kim, J.D. Kim, 윤종걸, J.H. Kong, 부상돈, 박윤

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Novel Heat Dissipating Cell Scheme for Improving a Reset Distribution in a 512M Phase-change Random Access Memory (PRAM) von Kang, D.H., Kim, J.S., Kim, Y.R., Kim, Y.T., Lee, M.K., Jun, Y.J., Park, J.H., Yeung, F., Jeong, C.W., Yu, J., Kong, J.H., Ha, D.W., Song, S.A., Park, J., Park, Y.H., Song, Y.J., Eum, C.Y., Ryoo, K.C., Shin, J.M., Lim, D.W., Park, S.S., Kim, J.H., Park, W.I., Sim, K.R., Cheong, J.H., Oh, J.H., Kim, J.I., Oh, Y.T., Lee, K.W., Koh, S.P., Eun, S.H., Kim, N.B., Koh, G.H., Jeong, G.T., Jeong, H.S., Kim, Kinam

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Operational PRAM analysis with PVT variations using process-aware compact model von Kim, Y.T., Kim, Y.G., Yang, G.Y., Lee, K.H., Horii, H., An, H.G., Kong, J.H., Lee, K.J., Park, M.H., Park, Y.K., Yoo, M.H.

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