LIA-QMS method for the quantity analysis of the hydrogen isotopes retention in first-wall components of Globus-M2 tokamak von Medvedev, O.S., Razdobarin, A.G., Shubina (Smirnova), E.V., Grishaev, M.V., Elets, D.I., Snigirev, L.A., Kolomiytsev, A.S., Nikolaev, A.V.

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Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures von Kolomiytsev, A.S., Gromov, A.L., Il'in, O.I., Panchenko, I.V., Kotosonova, A.V., Ballouk, A., Rodriguez, D., Ageev, O.A.

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Novel technology for controlled fabrication of aperture cantilever sensors for scanning near-field optical microscopy von Kolomiytsev, A.S., Kotosonova, A.V., Il’in, O.I., Saenko, A.V., Shelaev, A.V., Baryshev, A.V.

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Carbon tip aperture cantilevers: Fabrication & features in near-field magneto-optical imaging von Vysokikh, Yu. E., Mikhailova, T.V., Krasnoborodko, S. Yu, Kolomiytsev, A.S., Ilin, O.I., Shaposhnikov, A.N., Berzhansky, V.N., Bulatov, M.F., Churikov, D.V., Shevyakov, V.I.

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Nanoscale profiling of multilayer graphene films on silicon carbide by a focused ion beam von Kolomiytsev, A.S., Jityaev, I.L., Svetlichnyi, A.M., Fedotov, A.A., Ageev, O.A.

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Fabrication of advanced probes for atomic force microscopy using focused ion beam von Ageev, O.A., Kolomiytsev, A.S., Bykov, A.V., Smirnov, V.A., Kots, I.N.

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Investigation of the electrode material influence on the titanium oxide nanosize structures memristor effect von Avilov, V I, Kolomiytsev, A S, Tominov, R V, Alyabyeva, N I, Bykova, E M

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Characterization of field-emission cathodes based on graphene films on SiC von Konakova, R. V., Okhrimenko, O. B., Svetlichnyi, A. M., Ageev, O. A., Volkov, E. Yu, Kolomiytsev, A. S., Jityaev, I. L., Spiridonov, O. B.

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Formation of nanosize structures on a silicon substrate by method of focused ion beams von Ageev, O. A., Kolomiytsev, A. S., Konoplev, B. G.

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