Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures von Kolomiytsev, A.S., Gromov, A.L., Il'in, O.I., Panchenko, I.V., Kotosonova, A.V., Ballouk, A., Rodriguez, D., Ageev, O.A.

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Novel technology for controlled fabrication of aperture cantilever sensors for scanning near-field optical microscopy von Kolomiytsev, A.S., Kotosonova, A.V., Il’in, O.I., Saenko, A.V., Shelaev, A.V., Baryshev, A.V.

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Research of FIB local milling processes for creation of nanosized field emission structures von Panchenko, I V, Shandyba, N A, Kolomiytsev, A S

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Development of technology for the formation of vacuum field emission cells using focused ion beams von Panchenko, I V, Shandyba, N A, Kolomiytsev, A S

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Field emission cell with a W-cathode formed by local ion-stimulated deposition von Shandyba, N A, Kolomiytsev, A S, Panchenko, I V, Jityaev, I L

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Fabrication of probe tips via the FIB method for nanodiagnostics of the surface of solids by atomic force microscopy von Rodriguez, D J, Kotosonova, A V, Ballouk, H A, Shandyba, N A, Osotova, O I, Kolomiytsev, A S

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Investigation of local ion-stimulated carbon deposition to create vacuum field emission diodes von Panchenko, I V, Shandyba, N A, Kolomiytsev, A S, Lisitsyn, S A

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Investigation of the influence of the geometric parameters of AFM cantilevers on the resonant frequency of their oscillations von Panchenko, I V, Shandyba, N A, Ballouk, A, Rodrigues, D, Kolomiytsev, A S, Ageev, O A

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Investigation of the electrode material influence on the titanium oxide nanosize structures memristor effect von Avilov, V I, Kolomiytsev, A S, Tominov, R V, Alyabyeva, N I, Bykova, E M

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Nanosized Modification of the Silicon Surface by the Method of Focused Ion Beams von Kots, I. N., Polyakova, V. V., Morozova, Yu. V., Kolomiytsev, A. S., Klimin, V. S., Ageev, O. A.

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Planar multigraphene/SiC blade-shaped field emission nanostructures von Jityaev, I L, Svetlichnyi, A M, Kolomiytsev, A S

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Carbon tip aperture cantilevers: Fabrication & features in near-field magneto-optical imaging von Vysokikh, Yu. E., Mikhailova, T.V., Krasnoborodko, S. Yu, Kolomiytsev, A.S., Ilin, O.I., Shaposhnikov, A.N., Berzhansky, V.N., Bulatov, M.F., Churikov, D.V., Shevyakov, V.I.

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Nanoscale profiling of multilayer graphene films on silicon carbide by a focused ion beam von Kolomiytsev, A.S., Jityaev, I.L., Svetlichnyi, A.M., Fedotov, A.A., Ageev, O.A.

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Novel technology for fabrication of probe tips for SPM using focused ion beam-induced deposition method von Shandyba, N A, Kolomiytsev, A S, Panchenko, I V, Lisitsyn, S A

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Screening effect in matrix graphene / SiC planar field emmiters von Jityaev, I L, Svetlichnyi, A M, Kolomiytsev, A S, Ageev, O A

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Fabrication of probes for scanning near-field optical microscopy using focused ion beam von Kolomiytsev, A S, Shandyba, N A, Panchenko, I V, Lisitsyn, S A

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Advanced aperture cantilevers made by focused ion beam for both magnetic domain structure and morphology investigation in high resolution magneto optical microscopy von Vysokikh, Yu E, Krasnoborodko, S Yu, Kolomiytsev, A S, Fedotov, A A, Shaposhnikov, A N, Bulatov, M F, Churikov, D V, Shevyakov, V I

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Planar nanosized field emission cathodes on the basis of graphene semi-insulating silicon carbide fabricated by focused ion beam von Jityaev, L, Ageev, O A, Svetlichnyi, A M, Kolomiytsev, A S, Spiridonov, O B

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Light polarization and intensity behaviour in aperture cantilevers with carbon tip created by focused ion beam von Mikhailova, T V, Vysokikh, Yu E, Krasnoborodko, S Yu, Kolomiytsev, A S, Fedotov, A A

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Fabrication of tunnelling gap of nanomechanicalaccelerometer by focused ion beam von Ageev, O A, Gusev, E Yu, Kolomiytsev, A S, Lisitsyn, S A, Bykov, Al V

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