CEPPAD: Comprehensive energetic particle and pitch angle distribution experiment on POLAR von Blake, J. B., Fennell, J. F., Friesen, L. M., Johnson, B. M., Kolasinski, W. A., Mabry, D. J., Osborn, J. V., Penzin, S. H., Schnauss, E. R., Spence, H. E., Baker, D. N., Belian, R., Fritz, T. A., Ford, W., Laubscher, B., Stiglich, R., Baraze, R. A., Hilsenrath, M. F., Imhof, W. L., Kilner, J. R., Mobilia, J., Voss, D. H., Korth, A., G ll, M., Fisher, K., Grande, M., Hall, D.

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A quiescent state of 3 to 8 MeV radiation belt electrons von Selesnick, R. S., Blake, J. B., Kolasinski, W. A., Fritz, T. A.

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Heavy ion induced snapback in CMOS devices von Koga, R., Kolasinski, W.A.

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A method for characterizing a microprocessor's vulnerability to SEU von Elder, J.H., Osborn, J., Kolasinski, W.A., Koga, R.

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SEU test techniques for 256K static RAMs and comparisons of upsets induced by heavy ions and protons von Koga, R, Kolasinski, W A, Osborn, J V, Elder, J H, Chitty, R

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Heavy Ion-Induced Single Event Upsets of Microcircuits; A Summary of the Aerospace Corporation Test Data von Koga, R., Kolasinski, W. A.

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Simulation of Cosmic-Ray Induced Soft Errors and Latchup in Integrated-Circuit Computer Memories von Kolasinski, W. A., Blake, J. B., Anthony, J. K., Price, W. E., Smith, E. C.

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Effects of Heavy Ions on Microcircuits in Space: Recently Investigated Upset Mechanisms von Koga, R., Kolasinski, W. A.

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The Effect of Elevated Temperature on Latchup and Bit Errors in CMOS Devices von Kolasinski, W. A., Koga, R., Schnauss, E., Duffey, J.

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Techniques of Microprocessor Testing and SEU-Rate Prediction von Koga, R., Kolasinski, W. A., Marra, M. T., Hanna, W. A.

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Comparison of heavy ion and electron-beam upset data for GaAs SRAMs von Flesner, L.D., Zuleeg, R., Kolasinski, W.A.

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Heavy Ion Induced Upsets in Semiconductor Devices von Koga, R., Kolasinski, W. A., Imamoto, S.

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Latest trends in parts SEP susceptibility from heavy ions von Nichols, D.K., Smith, L.S., Soli, G.A., Koga, R., Kolasinski, W.A.

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Bevalac ion beam characterizations for single event phenomena von Koga, R., Katz, N., Pinkerton, S.D., Kolasinski, W.A., Oberg, D.L.

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Cost-effective numerical simulation of SEU von Rollins, J.G., Tsubota, T.K., Kolasinski, W.A., Haddad, N.F., Rockett, L., Cerrila, M., Hennley, W.B.

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Single Event Upset in SOS Integrated Circuits von Rollins, J. G., Choma, J., Kolasinski, W. A.

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Single Event Upset Rate Estimates for a 16-K CMOS SRAM von Browning, John S., Koga, R., Kolasinski, W. A.

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An auroral X-ray imaging spectrometer von Mizera, P. F, Kolasinski, W. A, Gorney, D. J, Roeder, J. L

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Numerical Simulation of SEU Induced Latch-Up von Rollins, J. G., Kolasinski, W. A., Marvin, D. C., Koga, R.

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Simulation of Cosmic Ray-Induced Soft Errors in CMOS/SOS Memories von Brucker, G. J., Chater, W., Kolasinski, W. A.

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